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5500 AFM
Brand: Agilent Technologies
Category: AFM/SPM Microscopes
Application Fields: Nano-Bio Sciences, Single DNA/RNA Analysis, Single Protein Analysis, Tissues Analysis, Molecular Imaging, Material Science, Biomaterials, Molecular Electronics, Thin Films, Materials for Energy, Semiconductors, Polymers and Composites, Coatings, Surface Science
The versatile Agilent 5500 AFM/SPM microscope is the ideal multiple-user research system, delivering all the advantages and performance that the entire series of Agilent modular AFM/SPM solutions has to offer.
The Agilent 5500 AFM/SPM microscope offers numerous unique features, such as... -
Nano Indenter G200
Brand: Agilent Technologies
Category: Nanoindentation
Application Fields: Material Science, Thin Films, Biomaterials, Coatings, Semiconductors, Polymers and Composites, MEMS characterization/Testing
The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement and measurement of deformation over six orders of magnitude (from nanometers to millimeters)....
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Sensofar PLu Neox
Brand: Sensofar
Category: Optical Profilometers
Application Fields: Material Science, Biomaterials, Surface Roughness, Thin Films, Solar Cells, Materials for Energy, Semiconductors, Coatings, Tribology, MEMS characterization/Testing, Micro Optics
3D Optical Profiler
Sensofar is proud to announce the introduction of the new Neox. This represents a major breakthrough in non-contact Optical 3D profiling with a dual core 3D measuring microscope combined with confocal and interferometry capabilities... -
Nano Indenter G300
Brand: Agilent Technologies
Category: Nanoindentation
Application Fields: MEMS characterization/Testing, Material Science, Biomaterials, Thin Films, Semiconductors, Polymers and Composites, Coatings
The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm. An excellent long-term investment for industrial users, it provides a fast, reliable method for acquiring mechanical data on uncut silicon wafers. The G300 permits testing of multiple layers, facilitating...