Enhanced Darkfield Hyperspectral Microscopy - Cytoviva at Nanosafety 2017

Enhanced Darkfield Hyperspectral Microscopy - Cytoviva at Nanosafety 2017
Post publication date: 
Tuesday, August 8, 2017

The Enhanced Darkfield Hyperspectral Microscopy (EDFM-HS) of Cytoviva enables optical observation and spectral characterization of a wide range of nanomaterials as they interact with both biological and materials-based matrixes. No labeling or other special sample preparation is required.

Schaefer would like to inform you that the Cytoviva microscope EDFM – HS will be exposed at “Nanosafety 2017”, an event organized by the INM Leibniz Institute for New Materials, which will take place in Saarbrücken, Germany, from the 11th to the 13th of October 2017. Here's the official website URL: http://www.nanosafety2017.de/

Dr Melinda Bartok will be happy to show you the microscope: how it works, what are the advantages of this particular technique, and answer to all your questions, in order to evaluate together your possible interest.

If you need other information about this opportunity, please ask to:

Dr Francesca Sbrana PhD
Science Technologies Specialist
Schaefer SEE srl

Mob +39-393 8479592
Email francesca.sbrana@schaefer-tec.it

Related products 

Cytoviva HSI Darkfield Hyperspectral Microscope
Visible Near Infrared (VNIR) and Short Wave Infrared (SWIR)

Partner 

Cytoviva