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atomic resolution
All the articles in our blog about atomic resolution
Wednesday, March 22, 2023
AFM Agilent 5100 e 5500 e Multimode - Nuova vita al tuo microscopio - Mantieni le modalità AFM esistenti e aggiungi nuove modalità avanzate!
Wednesday, February 8, 2023
Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.
Even for an experienced AFM user, choosing the right probe can be daunting. Using an...
Monday, January 16, 2023
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...
Friday, November 18, 2022
Nuovo accessorio per il Jupiter XR AFM: nanoTDDB
Abstract
In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...
Thursday, November 25, 2021
Schaefer's technological offer, for scientists and researchers, also includes acoustic booths, with a very high degree of customization. We have already gained significant experience in the field, delivering several booths to clients in industrial and academic research. Each...
Thursday, February 25, 2021
New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!
- Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Wednesday, August 5, 2020
Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...
Tuesday, July 21, 2020
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
Thursday, April 30, 2020
Cypher VRS Video-Rate AFM
Atomic Force Microscopy (AFM) is a uniquely powerful tool for virology research. High-resolution imaging techniques, including both AFM and electron microscopy, can easily resolve the size and shape of virus particles and even the organization of capsomeres in their capsid protein shells...
Thursday, March 12, 2020
The first and only full-featured video-rate AFM
Video-rate atomic force microscopy as a tool for single molecule biochemistry and biophysics
Join us Tuesday, March 17
08:00 PDT / 11:00 EDT / 15:00 BST / 16:00 CEST
Direct...
Tuesday, April 2, 2019
Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...
Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!
LiteScope...
Tuesday, March 19, 2019
Join us Tuesday, March 26 (Americas), Wednesday, March 27 (Europe), or Thursday, March 28 (Asia and Australia) for a webinar on the unique capabilities of the R9plus SPM Controller and its applications in the field of nano-optics. (Note, please feel free to attend...
Monday, June 5, 2017
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...
Monday, February 8, 2016
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly...
Monday, February 2, 2015
All the advantages of LT, None of the constraints
PanScan Freedom enables ultra low noise <1 pm imaging performance, with the cryostat running. Even noisy environments do not degrade performance, which was proven...