Schaefer's Blog

Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.

Last News

Tuesday, July 28, 2020

Why do we believe FluidFM can help solving some of the most critical challenges in CRISPR cell engineering?

What's the biggest story of Single Cell Analysis for 2019?

What are the biggest issues Genomics and Single Cell Analysis researches face in 2020?
What will 2020 hold for...

Friday, July 24, 2020

Digital FluidFM User Conference 2020

September 16, 09:30 – 12:00 (GMT/UTC +2)
Don't miss the chance to showcase your FluidFM-related applications, results and experiences to the FluidFM community.
Submission deadline: July 31, 2020

Tuesday, July 21, 2020

Webinar - Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy

Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST

Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...

Monday, July 6, 2020

July 15th : upcoming webinar on DWS

Join us on July 15th for a live webinar!

Prof. Samiul Amin (Manhattan College) will be presenting new applications of DWS optical microrheology in cosmetic formulations. The microstructure of surfactant/biosurfactant systems and its characterization through high frequency...

Wednesday, June 24, 2020

AFM Electrical characterization with ResiScope, Soft ResiScope & HD-KFM modes

Webinar's key topics:

  • Advanced CSI AFM Modes – Electrical measurements
  • HD-KFM mode : Concept, advantages and exemples
    • Most advanced single-pass KFM mode (no lift)
    • Much higher sensitivity & resolution