Friday, March 22, 2019

Nenovision Litescope AFM-in-SEM - Free of Charge Measurement April – May 2019

Nenovision Litescope AFM-in-SEM

Explore capabilities of Nenovision AFM LiteScope™ 

  • AFM specially designed for easy SEM integration
  • A wide range of applications in the field of Material Science and Nanotechnology, Semiconductor Industry and Life Science
  • Unique correlative microscopy technique CPEM™
  • User-friendly and intuitive web-based interface

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For more information contact us!

Nenovision

Scanning Probe Microscope designed for easy integration into the Electron Microscopes.
Nenovision Litescope
What do I get?
  • Opportunity to discover the advantages of AFM-in-SEM for my application
  • Individual approach
  • Sample measured by unique CPEM™ technique
  • Document with results and explanations
  • Additional discussion about measurement & results via Skype
Why AFM-in-SEM ?
Precise AFM tip navigation to the region of interest by SEM
Precise AFM tip navigation to the region of interest by SEM
  • Precise AFM tip navigation to the region of interest by SEM
  • In-situ 3D topography and height/depth profiling of selected structures
  • Material vs. topography contrast
  • Roughness measurement
What is Correlative Probe and Electron Microscopy CPEM™?
Correlative Probe and Electron Microscopy CPEM™
Correlative Probe and Electron Microscopy CPEM™

CPEM technology is the first of its kind on the market. It allows both AFM and SEM measurements to be taken in the same place, at the same time and using the same coordination system. Only CPEM technology provides you with all the true correlative imaging-related advantages of both the AFM and the SEM technique.

  • CPEM provides multidimensional correlation imaging – images from an SEM are extended into 3D view.
  • Using CPEM, it is possible to quickly and accurately distinguish the topographic and the material contrast in SEM images.
  • CPEM correlates, in an appropriate fashion, two or more SEM signals with the measured topography such as SE, BSE, EBIC, CL, etc.
  • CPEM makes it possible to measure AFM and SEM simultaneously under the same specimen conditions, at the same measurement speed, etc.
  • A combined AFM and SEM scanning system enable an accurate image correlation, elimination of drift and other inaccuracies.
Application examples
Characterization of milled surfaces by FIB or deposited by GIS – in-situ 3D topography and height/depth profiling of selected structures
Characterization of milled surfaces by FIB or deposited by GIS – in-situ 3D topography and height/depth profiling of selected structures