‹ 28/08/26 - Schaefer SEE and Izon Science at the III National Congress of the Italian Core Faciliti...

Schaefer SEE at AITEM 2026: Advanced Solutions for Electron Microscopy and 3D Optical Metrology

Event - Congress -Workshop

Sunday 06 September 2026 - 16:00 to Tuesday 08 September 2026 - 17:00

Schaefer SEE at AITeM 2026 in Udine with Semplor NANOS, NANOS EBSD, ONYX and Sensofar S neox 6 instruments

Post publication date:

Saturday, September 5, 2026

Schaefer SEE Srl will be attending AITEM 2026, presenting advanced solutions for material characterization, electron microscopy and surface metrology.

Visitors will be able to see the Semplor NANOS tabletop SEM and obtain firsthand information about Sensofar’s new S neox 6 3D optical profiler. The event will also provide an opportunity to discover two additional innovations from Semplor: the ONYX large-stage tabletop SEM and the new NANOS configuration with integrated EBSD capabilities.

Meet Us at AITEM 2026!

AITEM's website

NANOS: Accessible High-Resolution Electron Microscopy

Semplor NANOS compact tabletop SEM for high-resolution imaging and EDS elemental analysis

Compact, robust and designed to make scanning electron microscopy more accessible, NANOS combines high-resolution SEM imaging with integrated EDS elemental analysis.

The instrument delivers a resolution of less than 8 nm and magnification up to 200,000×. Its high- and low-vacuum operating modes support a wide range of conductive and non-conductive samples. NANOS can be installed in a standard laboratory without a cleanroom, dedicated infrastructure or vibration isolation, making it an excellent solution for research, education and industrial a

New NANOS EBSD: From Imaging to Crystallographic Insight

Semplor NANOS tabletop SEM with integrated EBSD for crystallographic and elemental analysis

The new NANOS EBSD configuration brings Electron Backscatter Diffraction analysis to a compact tabletop SEM platform.

In addition to high-resolution imaging and elemental analysis by EDS, the system can provide detailed crystallographic information, including crystal orientation, phase identification and grain structure. Its eucentric stage can be tilted up to 70°, allowing users to move from conventional SEM imaging to the EBSD measurement position while keeping the region of interest centred and in focus.

The integration of EDS and EBSD creates a streamlined workflow for complementary elemental and crystallographic characterization.

ONYX: The Large-Stage Tabletop SEM

Semplor ONYX large-stage tabletop SEM for large samples and high-throughput analysis

Another important new addition to the Semplor range is ONYX, a tabletop SEM developed for large samples and high-throughput workflows.

ONYX features a 110 × 110 mm motorized stage inside a 220 × 220 mm chamber and can accommodate large components or multiple samples in a single setup, including up to 64 half-inch SEM stubs. It combines high-resolution SE and BSE imaging with embedded EDS for elemental analysis.

Its large sample capacity, automated workflow capabilities and intuitive Discover software make ONYX particularly suitable for industrial laboratories, R&D, quality control and research environments requiring greater flexibility and productivity.

S neox 6: The New Generation of 3D Optical Profiling

Sensofar S neox 6 non-contact 3D optical profiler for advanced surface characterization

The new Sensofar S neox 6 expands advanced, non-contact 3D surface characterization with greater speed, precision and flexibility.

Its multi-technology architecture combines several optical measurement techniques within a single platform:

Ai Focus Variation for large, rough and steep surfaces
Confocal technology for high-lateral-resolution measurements
Interferometry for exceptional height resolution
Spectroscopic Reflectometry for rapid, non-destructive measurement of transparent thin films and layered materials

Compared with the previous generation, the S neox 6 offers acquisition speeds up to twice as fast. New features include a motorized tip-tilt system for faster automatic levelling, a 100 mm motorized Z range, direct autofocus and enhanced automation.

The S neox 6 is designed for demanding applications in semiconductors and advanced packaging, precision manufacturing, aerospace, medical devices, photonics and surface engineering.