AppNano manufactures probes with various spike lengths and widths for trenches and deep features. SPM/AFM instrument manufacturers use different probe chip mounting angles. AppNano provides options to meet all commercial AFM systems. Additionally, we can fabricate HART probes to meet custom...
Custom MEMS & Nanofabrication - Probes
In addition to providing you with his standard catalog of products, Applied NanoStructures enjoys working with customers to develop new probes or devices for advanced applications. His experienced Research and Development team takes pride in using his knowledge in silicon nanofabrication technology to realize these new ideas.
The TAP-TALL are specially designed 65 μm tall tip probes for profiling high aspect ratio features and deep trenches. Standard probes are only suitable for 10-15 μm features.
C olloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as "Colloidal Probes" and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The...
Ball Probes are designed for applications that require hard contact with the sample. The tip apex is created using Electron Beam Deposited high density carbon. It is hemispherical in shape and has extremely smooth surface.
Plateau (PTU) Series Probes are produced with a flat top and a conical tip.
The Plateau Probe provides a well defined contact area.
Custom Options Available - Custom gold and platinum coatings available upon request.