Concept Scientific Instruments has developed an alternative measurement mode called Soft Intermittent Contact mode (or Soft IC) that combines the advantages of contact mode and force spectroscopy but presentencing from their inconvenient like friction forces or intrinsic slowness....
SPM/AFM Control Systems & Measurement Options
We distribute SPM & AFM Control Systems & Measurement options designed, manufactured and provided by RHK Technology and CSI Instruments.
RHK Technology has a long and proud history of accomplishment in SPM Control. With over 1,000 controllers installed around the world, RHK has brought a continual series of advanced capabilities to the nanotechnology field for decades. From the early days of STM, to contact AFM, then NC-AFM, through the transition to digital electronics, and on to new paradigms for graphical interface ease of use and total hardware integration, RHK control platforms consistently bring powerful new functionality to researchers worldwide.
CSInstruments began by providing the AFM accessories ResiScope, which allows the characterization of conductive surface. They currently offer new modes and controllers for a variety of applications in the field of nanoscience, materials, surface science, polymers, thin films, semiconductors, biomaterials, photovoltaics, conductive surface characterization.
The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software...
Soft ResiScope : AFM electrical characterization on soft sample
This unique and innovative AFM mode is able to expand the fields of applications of the « ResiScope II » to soft samples ...
The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several...
Kelvin Force Microscopy (KFM) allows to measure the surface potential between an oscillating conductive tip and the surface. Surface potential measurement can be used to determine intrinsic properties...
R9plus BUILT for a PURPOSE: Your Research, Your Success When you are pioneering the frontiers of Nanoscience, you can count on RHK’s new R9plus SPM Controller to lead the way. Its remarkable advancements originate from direct user feedback, RHK’s Technical Advisory Board, and...
The QFM-Module comprises two components:
5 kHz - 20 kHz (Tapping Mode in liquid)
20 kHz - 100 kHz (Magnetic/Electrostatic Force Microscopy)
100 kHz - 500 kHz (Tapping Mode in air...
RHK’s new R9 Controller provides a complete, fully digital AFM/STM control system in an ultra-integrated, user-configurable and programmable one-box solution. As the next-generation in RHK’s long history of innovative control technology, R9 delivers...