TERS Raman AFM/STM Microscopes


Tip-enhanced Raman Spectroscopy (TERS) is a novel scanning probe microscopy (SPM) technique that combines chemical/structural characterisation capability of Raman spectroscopy with the spatial resolution of an atomic force microscopy (AFM). In our catalogue you'll find next-generation platforms for nanoscale spectroscopy and chemical mapping.
Purpose-Built Hardware for lowest noise, highest performance, and industry leading light collection. Simplified alignment with up to 6-axis piezo-controlled parabolic mirror and novel elliptical mirror. No wavelength limitations, from UV to THz, enabled by unique all reflective optics. Innovation in every nanometer from the industry's most experienced designers.