Schaefer News

Event - Congress -Workshop

18/03/2024 - 09:00 to 22/03/2024 - 17:00
Galaxy Dual Controller for Multimode AFM and new AFM Nano-Observer II - Roadshow from 18th to 22th March 2024
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Online Webinar - Presentation

27/11/2023 - 13:00 to 15:00
07/12/2023 - 05:00 to 07:00
14/12/2023 - 23:00 to 15/12/2023 - 01:00
Explore TomoAnalysis - Holotomography Image Analysis Software
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Browse our Catalogue

Accessories AFM/SPM/STM/SEM/TEM
Accessories / Consumables / Software AFM, SPM, STM, SEM, Optical Profilers
Accessories/Consumables High Vacuum and Ultra High Vacuum (UHV)
Accessories / Consumables High Vacuum and Ultra High Vacuum (UHV)
Automated recognition systems
Automated recognition systems
Bio-nanoparticles
Bio-nanoparticles
Digital Microscopy
Instruments for Measurement and Control of Physical Quantities
Instruments for Measurement and Control of Physical Quantities
Laboratory Equipment
Laboratory Equipment
Neoscan software - Micro CT Scanner
Micro CT Scanner Software
Microscopes for Nanoscale Imaging
Microscopes for Nanoscale Imaging
Nanoparticles Analysis
Nanoparticles Analysis
Physical and chemical analysis instruments
Physical and chemical analysis instruments
Profilometers - Objectives
Profilometers
Research Quality Nanoparticles
Research Quality Nanoparticles
Sheet Resistance Mapping
Single Cell Analysis and Manipulation
Single Cell Analysis and Manipulation
Spin Coaters
Spin Coaters
Surface Mechanical Testers
Surface Mechanical Testers
Thin Films
Thin Films
Vibration Isolation Systems
Vibration Isolation Systems
NEOSCAN Scientific grade, high-resolution micro-CT scanner
X-ray microtomography

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