These probes are formed by a unique patented process ensuring the best possible nanomechanical and electrical performance. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. By using wear-resistant sharp diamond probes the tip-...
Adama Innovations operates world-class technology on wafer-scale, producing hundreds of precisely controlled AFM probe tips consecutively that are subject to a rigorous quality control procedure to insure that the product adheres to the high standards that reflect the ethos of the company and their ambition to meet the demands of customers.
Utilising the latest in advanced manufacturing capability, Adama's innovative and unique technology is a simple and efficient method to create bespoke micro- and nanoscale shapes and profiles in diamond and other hard carbon based materials. The repeatability and accuracy of the technique allows for precision engineering in desired locations.
Customers that need to know their tip shape accurately can now avail of the optional measurement service. Adama now offers a -SEM option which includes a high-resolution SEM image along with measurement of the tip radius at 5, 50 and 100 nm down from the tip apex for every tip in the box. These optional services are available for all Adama probes except -LC and -TC products. Please append -SEM to the model number when ordering.
All Adama probes are now included in the Sader Method - Global Calibration Initiative. This allows you to calibrate each probe by measuring only the resonance frequency (f) and quality factor (Q). Just go tosadermethod.org and enter these two numbers in the @LDV entry for your product and the spring constant will be displayed along with an error estimate. This is the most accurate method available for you to get the spring constant for your products and typically allows < 5 % uncertainty.
The spring constant (k) is determined by the formula
k = A x Q x f^1.3
where A is given by your probe model.
Super Sharp diamond probes are capable of atomic resolution topographical and electrical imaging straight out of the box. These tips offer the highest electrical resolution on the market. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays...
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes are designed for nanoindenation...
Cone shaped probes offer a cost effective solution ideally suited to the long lifetime imaging of low relief samples. These probes offer the lifetime and nanomechanical advantages of diamond at higher resolution and without the variability in tip shape associated with competing diamond coated...
The High Aspect Ratio (HAR) pillar probes offer an ideal solution to robust imaging of samples with features with aggressive aspect ratios. Each probe consists of a cylindrical shaped pillar tip made of strong and conductive single crystal diamond.
These pillar probes, like on all our...