IIl The Nano-Observer is a flexible and powerful STM/AFM Microscope. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (...
CSI Concept Scientific Instruments
CSInstruments is a French scientific equipment manufacturer specialized in the conception of Atomic Force Microscope and options designed for existing AFM (Resiscope, High Voltage Amplifier, Magnetic modules ...).
Its activities are focused on research, development and design of simple solution, innovative and quality around the AFM to allow researchers and industry to improve their research project.
The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Category:Application Fields:Nanoparticles, Surface Science, Nano-Bio Sciences - Nanobiotechnology, Single Living Cell Analysis, Single DNA/RNA Analysis, Single Protein Analysis, Tissues Analysis, Material Science, Biomaterials, Solar Cells, Thin Films, Molecular Electronics, Materials for Energy, Semiconductors, Polymers and Composites
The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several...
Kelvin Force Microscopy (KFM) allows to measure the surface potential between an oscillating conductive tip and the surface. Surface potential measurement can be used to determine intrinsic properties...
Soft ResiScope : AFM electrical characterization on soft sample
This unique and innovative AFM mode is able to expand the fields of applications of the « ResiScope II » to soft samples ...