Oxford NanoAnalysis

Providing leading-edge tools for SEM, TEM & FIB

Oxford Instruments NanoAnalysis provides cutting-edge tools that enable material characterization and sample manipulation at the nanoscale. Using electron microscopes (SEM and TEM) and focused ion beam (FIB) systems, OIN tools are applied in research and development across a wide range of academic and industrial applications, including:

Additive manufacturing
Automated mineralogy
Battery materials
Correlative microscopy
Gunshot residue
High-temperature EDS analysis
Non-metallic inclusions
Particle analysis
Pharmaceutical applications
Technical cleanliness

Introduction to Energy Dispersive Spectroscopy (EDS/EDX) Large Area Mapping in SEM

Products List

SEM - Scanning Electron Microscopes

FIB-SEM

Backscattered Electron and X-ray (BEX)

EDS for SEM and FIB

Xplore

Affordable and convenient SEM-EDS detector ideal for simple application requirements