Oxford NanoAnalysis
Providing leading-edge tools for SEM, TEM & FIB
Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale.
Used on electron microscopes (SEM and TEM) and ion-beam systems (FIB), OIN tools are used for R&D across a wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy, and forensics.
