RHK - Panscan

Stability in extreme environments

All Pan-style scan heads owe their origin and name to Dr. Shuheng Pan, University of Houston - Department of Physics, who was the original developer of this piezo-motor style.

His Pan scanner is well known for its stability in extreme environments. RHK collaborated directly with Dr. Pan to commercialize his design, enhancing the original by adding XY offsets, in-situ tip exchange, multiple points of optical access, and AFM-qPlus probes – all in a remarkably rugged and compact modular package. PanScan is available with STM only or with both STM and AFM capabilities. AFM-qPlus and STM probes are switchable in a vacuum. qPlus sensors include a conductive tip for combined AFM and STM scanning techniques. Both of these complementary proximal probe techniques provide atomic resolution. The unique value of AFM is its applicability to a broader range of materials, especially insulators. By utilizing probe holders with the same mounting base, you can easily load both STM and AFM-qPlus probes into the tip storage positions and switch between them in situ. The compact size and non-magnetic construction of PanScan make it ideal for operation from mK to 400K. Uniquely designed for easy adaptation, PanScan is available in a variety of configurations from kits for the atmospheric operation to complete cryogen-free low-temperature systems.

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