Cypher ES Environmental AFM

Full environmental control features

The Asylum Research Cypher ES builds on the exceptional performance of the Cypher S and adds full environmental control features. The same high resolution, speed and stability are maintained while easily operating in controlled gas or liquid environments, at temperatures from 0-250°C, and in some of the harshest chemical environments. The Cypher ES is the ultimate AFM for the most demanding experimental requirements.

  • Routinely achieve higher resolution than other AFMs
  • Fast scanning with results in seconds instead of minutes
  • Every step of operation is simpler for remarkable productivity
  • Small footprint in the lab, huge potential to grow in capability
  • Support that goes above and beyond your expectations
  • Enables gas and liquid perfusion through a sealed cell
  • Controls sample temperature over a wide 0–250°C range
  • Broadest compatibility with harsh chemicals
Routinely achieve higher resolution than other AFM microscopes
  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources
Fast scanning with results in seconds instead of minutes
  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM
Every step of operation is simpler for remarkable productivity
  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative
Small footprint in the lab, huge potential to grow in capability
  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes
Support that goes above and beyond your expectations
  • Includes a standard two-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry
Enables gas and liquid perfusion through a sealed cell
  • Fully sealed sample cells maintain a controlled environment and eliminate the risk of leaks
  • Compatible with fast scanning and all environmental control accessories
Controls sample temperature over a wide 0–250°C range
  • Two options are available: Heating to 250°C or Heating and Cooling 0–120°C
  • Low-drift design lets you keep imaging while ramping the temperature
  • Quick and easy to setup and use, no external controllers, tubing, wires, etc.
Broadest compatibility with harsh chemicals
  • Sample cells are constructed so that only fused silica and the probe clip (PEEK or stainless steel) are in contact with liquid
  • Optional glovebox configuration allows use with oxygen or water sensitive materials
Included Operating Modes
  • Contact mode
  • DART PFM
  • Dual AC
  • Dual AC Resonance Tracking (DART)
  • Electrostatic Force Microscopy (EFM)
  • Force curves
  • Force Mapping Mode (force volume)
  • Force modulation
  • Frequency modulation
  • Kelvin Probe Force Microscopy (KPFM)
  • Lateral Force Mode (LFM)
  • Loss tangent imaging
  • Magnetic Force Microscopy (MFM)
  • Nanolithography
  • Nanomanipulation
  • Phase imaging
  • Piezoresponse Force Microscopy (PFM)
  • Switching spectroscopy PFM
  • Tapping mode (AC mode)
  • Tapping mode with digital Q control
  • Vector PFM
Optional Operating Modes
  • AM-FM Viscoelastic Mapping Mode
  • Contact Resonance Viscoelastic Mapping Mode
  • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
  • Current mapping with Fast Force Mapping
  • Electrochemical Strain Microscopy (ESM)
  • Fast Force Mapping Mode
  • High voltage PFM
  • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
  • Scanning Microwave Impedance Microscopy (sMIM)
  • Scanning Tunneling Microscopy (STM)

Note: Some optional modes on the Cypher ES require blueDrive photothermal excitation. sMIM requires the Cypher S scanner.