Cypher S AFM Microscope

The base model of the Cypher AFM microscope family

The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.

  • Routinely achieve higher resolution than other AFM microscopes

  • Fast scanning with results in seconds instead of minutes
  • Every step of operation is simpler for remarkable productivity
  • Small footprint in the lab, huge potential to grow in capability
  • Support that goes above and beyond your expectations

Videos

Webinar: There's No Other AFM Like Cypher - Roger Proksch and Mario Viani provide a thorough review of some of the many features and capabilities that set Cypher AFMs apart from all others
Sublimation of an anthracene crystal in air - Imaged using the Cypher S at 20.8 Hz line rate
Surface reconstruction of a calcite crystal face - Imaged using the Cypher S at 40 Hz line rate
High speed PFM on a periodically poled lithium niobate sample - Imaged using the Cypher S at 39 Hz line rate. This example demonstrates that high speed AFM can go beyond topography.

Files

AttachmentSize
PDF icon Cypher Family Brochure6.16 MB

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Routinely achieve higher resolution than other AFM microscopes
  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources
Fast scanning with results in seconds instead of minutes
  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM
Every step of operation is simpler for remarkable productivity
  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative
Small footprint in the lab, huge potential to grow in capability
  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes
Support that goes above and beyond your expectations
  • Includes a standard two-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry
Included Operating Modes
  • Contact mode
  • DART PFM
  • Dual AC
  • Dual AC Resonance Tracking (DART)
  • Electrostatic Force Microscopy (EFM)
  • Force curves
  • Force Mapping Mode (force volume)
  • Force modulation
  • Frequency modulation
  • Kelvin Probe Force Microscopy (KPFM)
  • Lateral Force Mode (LFM)
  • Loss tangent imaging
  • Magnetic Force Microscopy (MFM)
  • Nanolithography
  • Nanomanipulation
  • Phase imaging
  • Piezoresponse Force Microscopy (PFM)
  • Switching spectroscopy PFM
  • Tapping mode (AC mode)
  • Tapping mode with digital Q control
  • Vector PFM
Optional Operating Modes
  • AM-FM Viscoelastic Mapping Mode
  • Contact Resonance Viscoelastic Mapping Mode
  • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
  • Current mapping with Fast Force Mapping
  • Electrochemical Strain Microscopy (ESM)
  • Fast Force Mapping Mode
  • High voltage PFM
  • Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
  • Scanning Microwave Impedance Microscopy (sMIM)
  • Scanning Tunneling Microscopy (STM)