CSI and Schaefer SEE are organizing a demo tour in Italy to present the Galaxy Dual for Multimode and the AFM Nano-Observer II.
Give your AFM a second life: the Galaxy Dual Controller renews and improves the performance of your AFM with...
AFM microscopy
All the articles in our blog about AFM microscopy
Friday, February 16, 2024
Wednesday, March 22, 2023
AFM Agilent 5100 e 5500 e Multimode - Nuova vita al tuo microscopio - Mantieni le modalità AFM esistenti e aggiungi nuove modalità avanzate!
FREE webinar on Thursday, 30th March 2023
Two time zones available
See in real time how your old...
Wednesday, February 8, 2023
Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.
Even for an experienced AFM user, choosing the right probe can be daunting. Using an...
Monday, January 16, 2023
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...
Friday, November 18, 2022
Nuovo accessorio per il Jupiter XR AFM: nanoTDDB
Abstract
In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...
Wednesday, October 19, 2022
Webinar host: Mathieu Cognard, product manager for SPM applications,
Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert
In this webinar, DS will demonstrate some of the...
Thursday, May 5, 2022
Would you like to get an exclusive first glimpse at the new features coming in Mountains® 9.2?
Then register now to join this upcoming webinar in which Alexis Morand, Learning engineer at Digital Surf, will walk you through the highlights of the latest version of...
Thursday, November 25, 2021
Schaefer's technological offer, for scientists and researchers, also includes acoustic booths, with a very high degree of customization. We have already gained significant experience in the field, delivering several booths to clients in industrial and academic research. Each...
Thursday, February 25, 2021
New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!
- Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Wednesday, August 5, 2020
Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...
Tuesday, July 21, 2020
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
Wednesday, June 24, 2020
Webinar's key topics:
- Advanced CSI AFM Modes – Electrical measurements
- HD-KFM mode : Concept, advantages and exemples
- Most advanced single-pass KFM mode (no lift)
- Much higher sensitivity & resolution
Monday, May 18, 2020
Wednesday, May 27th, 2020 from 8:00 AM - 10:00 AM PDT (3:00 PM - 5:00 PM GMT)
An online virtual symposium sponsored by Oxford Instruments Asylum Research on Applications of Atomic Force Microscopy in Virology Research. The symposium will feature a panel of...
Monday, May 11, 2020
Galaxy Dual AFM Controller
With ResiScope AFM mode and Galaxy Dual Controller
The Galaxy Dual Controller can incorporate ResiScope mode, the unique AFM mode able to measure AFM...
Thursday, April 30, 2020
Cypher VRS Video-Rate AFM
Atomic Force Microscopy (AFM) is a uniquely powerful tool for virology research. High-resolution imaging techniques, including both AFM and electron microscopy, can easily resolve the size and shape of virus particles and even the organization of capsomeres in their capsid protein shells...
Thursday, March 12, 2020
The first and only full-featured video-rate AFM
Video-rate atomic force microscopy as a tool for single molecule biochemistry and biophysics
Join us Tuesday, March 17
08:00 PDT / 11:00 EDT / 15:00 BST / 16:00 CEST
Direct...
Friday, January 31, 2020
Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact...
Monday, November 18, 2019
The ultra-low surface friction of graphene and other 2D materials offers exciting possibilities for nano-thin lubricants in next-generation MEMS and NEMS devices. The ability to actively control, and preferably minimize, friction would help realize the full potential of this application. In this...
Thursday, October 3, 2019
Live Webinar: October 16 16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST
Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...
Tuesday, April 2, 2019
Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...
Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!
LiteScope...
Tuesday, March 19, 2019
Join us Tuesday, March 26 (Americas), Wednesday, March 27 (Europe), or Thursday, March 28 (Asia and Australia) for a webinar on the unique capabilities of the R9plus SPM Controller and its applications in the field of nano-optics. (Note, please feel free to attend...
Friday, March 15, 2019
Oxford Instruments Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM), the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200...
Tuesday, June 20, 2017
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
Monday, June 5, 2017
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...
Wednesday, April 5, 2017
Exchange your old equipment and get a percentage discount on the purchase of an AFM microscope Nano-Observer!
The Nano-Observer AFM microscope is 5 years old! To celebrate, CSI with Schaefer are offering up to 30% discount on the purchase of a new Nano-Observer when you...
Monday, September 5, 2016
Schaefer is pleased to present you a long interview with Mr Craig Wall, PhD, Director of Marketing at RHK Technology. Mr Wall in this interview talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free afm spm low temp system and the high level performance it...
Tuesday, August 2, 2016
Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...
Wednesday, June 22, 2016
Follow the Euro 2016 with CSI and Win Prizes!
Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!
...Tuesday, May 31, 2016
Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...
Tuesday, April 5, 2016
CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....
Monday, February 8, 2016
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly...
Wednesday, October 21, 2015
Schaefer and the team at RHK Technology is excited to announce the launch of the new 9K PanScan Freedom System! Customers will now have the option to choose between the 15K and 9K versions of the cryogen-free SPM systems.
Tuesday, October 13, 2015
Your partner in nanotechnology and innovation leader in SPM control systems welcomes you to join the next webinar in our Coffee Talk webinar series.
Did you know that you can use the R9 controller's flexibility to collect many more measurements in less time? You will be...
Tuesday, September 15, 2015
A new video has been uploaded recently on YouTube. It provides a complete overview of the AFM Nano-Observer microscope, manufactured by CSI Instruments. Now this instrument is even easier to use, thanks to the touch screen control. You can operate the...
Tuesday, January 13, 2015
Schaefer is proud to offer to their customers a special promo, to evaluate the all-diamond AFM probes NaDia Probes, manufactured by Advanced Diamond Technologies. Those AFM probes are built with a single, monolithic diamond structure. The key...