Lyncée Tec
The Products
-
DHM R2200 series
Brand: Lyncée Tec
Category: Optical Profilometers
Application Fields: MEMS characterization/Testing
Real-time measurements extended to 15 μm high steps keeping nanometer vertical resolution
The DHM R2200 family performs measurements at two wavelengths simultaneously.
Its innovating optical schema is composed of two nested DHM with common object path and...
-
DHM T1000 series
Brand: Lyncée Tec
Category: Optical Profilometers
Application Fields: MEMS characterization/Testing, Single Living Cell Analysis, Cellular Dynamics in Real Time, Separate morphology and refractive index measurements, Tissues Analysis
Lyncée Tec’s DHM T1000 series is composed of the only transmission configured optical profilers on the market.
Based on Digital Holographic Microscopy technology, its contactless full-field 3D optical topography performed at video rate makes it an ideal tool for quantitative dynamic and... -
DHM R1100 series
Brand: Lyncée Tec
Category: Optical Profilometers
Application Fields: MEMS characterization/Testing
The ultimate optical profiler with sub-nanometer resolution and no vertical scanning needed up to 10 μm.
Lyncée Tec’s DHM R1100 series of reflection configured high precision optical profilers offers the ultimate technology based on Digital Holographic Microscopy.
... -
DHM 1000
Brand: Lyncée Tec
Category: Profilometers
Application Fields: MEMS characterization/Testing
Applications
The DHM 1000 family enables contactless measurement without sample preparation for a wide range of materials and shapes down to the nanoscaleRobust & stable
The short acquisition time (a few microseconds)... -
DHM R1000 series
Brand: Lyncée Tec
Category: Optical Profilometers
Application Fields: MEMS characterization/Testing
The evolutive cost-effective optical profiler with real-time full-field sub-nanometer resolution
Lyncée Tec’s DHM R1000 series of reflection configured high precision optical profilers is based on Digital Holographic Microscopy technology. Its contactless full-field 3D...
