The new Agilent 8500 FE-SEM offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. This compact, innovative system has been optimized for low-voltage imaging, extremely high surface contrast, and resolution typically found only in much larger and more expensive field emission...
Four Independent, Cryogenic, Atomic-Resolution Probes A true low-temperature (10K) UHV 4-Probe system is one of a family of multi-probe UHV SPM systems made possible by RHK Technology. This system provides a complete multi-technique, multi-chamber UHV system and includes all control electronics and...
Schaefer SEE sells two economical microscopes called smartWLI-Basic and smartWLI-Extended as well as an upgrade to existing microscopes called smartWLI-microscope...
The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm. An excellent long-term investment for industrial users, it provides a fast, reliable method for acquiring...
The Nano Indenter G200 is the most accurate, flexible, user-friendly instrument for nanomechanical testing. Electromagnetic actuation allows unparalleled dynamic range in force and displacement...
The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or an inverted confocal microscope, letting life science...
The Agilent 5600LS utilizes a fully addressable 200mm x 200mm stage and a new, low-noise AFM design to image large samples in air or smaller samples in liquid, and under temperature control....
Based on the popular Agilent 5400 AFM, the 5420 has been re-engineered to provide lower noise, better performance, and greater versatility. Featuring a new ergonomic design and improved...
The Agilent 5500 ILM system combines high-resolution AFM imaging with the direct optical viewing capability of an inverted light microscope to provide both atomic force and optical microscopy data...