RHK Technology advances in Scanning Probe Microscope help enable novel results

RHK TERS Tip Enhanced Raman Spectroscopy
Post publication date: 
Tuesday, February 10, 2015

RHK Technology has been a leader of Scanning Probe Microscope technology since the introduction of its first STM control system in 1988.  Hundreds of the world’s leading research groups depend on RHK’s cutting edge products to help meet their research goals. 

Already well known for its line of UHV SPMs, RHK has recently expanded its product line to include Tip Enhanced Raman Spectroscopy microscopes (TERS) and Scattering Near Field Optical Microscopes (sSNOM) for the ambient as well as UHV and cryogenic environments. 

These unique new designs provide atomic resolution as well as optimal light collection paths and will greatly increase the adoption of these techniques in a wide range of research fields.

PAN SCAN Helium Free

RHK's new Helium Free Cryogenic SPM is the world's first commercial SPM that achieves atomic resolution without liquid cryogen, opening the world of cryogenic SPM to labs unable to obtain or afford liquid helium.

R9 SPM Control System

RHK's R9 SPM Control has continued to evolve to bring users an unprecedented combination of extremely low noise and ultra-high bandwidth with the ability to image the lowest level signals at frequencies up to 20 MHz. The R9's digitally integrated lockins, PLLs, feedback loops and other optimized user-configurable firmware modules provide unparalleled capability and ease of use and is ideal for both the beginning user as well as the most advanced requirements.

Related products 

PanScan Freedom
Cryogen free ultra-low noise LT (7 K chilled tip/sample) STM- AFM/qPlus System

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RHK Technology