Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact and are ideal for C-AFM, EFM, KPFM PFM, SCM, SMM, SMIM, and SNOM applications.
Each probe is imaged by FE-SEM to verify its tip radius. The probes have cantilever frequencies from 4.5kHz up to 100kHz. They also have a long lifetime and high reliability in electrical measurements. There is never an issue with conductivity because the probe tips are purely metallic - as it wears, it remains fully conductive. It also has a long tip shank length, which reduces stray capacitance. Many users who perform electrical measurements order these probes regularly because of these benefits.
Multiferroic (Nd, Fe)-doped PbTiO 3 thin films obtained by pulsed laser deposition M Dumitru-Grivei, V Ion, R Birjega, A Moldovan… - Applied Physics A, 2019
Toward Improving Ambient Volta Potential Measurements with SKPFM for Corrosion Studies CM Efaw, T da Silva, PH Davis, L Li, E Graugnard… - Journal of The Electorchemical Society, 2019
Farming thermoelectric paper D Abol-Fotouh, B Dörling, O Zapata-Arteaga… - Energy & Environmental …, 2019
Supporting information for Synthesis of phosphonic acid ligands for nanocrystal surface functionalization and solution processed memristors J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby…2018
Disentangling Topographic Contributions to Near-field Scanning Microwave Microscopy Images KJ Coakley, S Berweger, TM Wallis, P Kabos - Ultramicroscopy, 2018
Imaging on the Nanoscale with THz Time-Domain, Emission and Pump-Probe Microscopy P Klarskov, A Pizzuto, DM Mittleman - 2018 43rd International Conference on Infrared …, 2018
Ballistic tracks in graphene nanoribbons J Aprojanz, SR Power, P Bampoulis, S Roche… - Nature Communications, 2018
Synthesis of Phosphonic Acid Ligands for Nanocrystal Surface Functionalization and Solution Processed Memristors J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby… - 2018
Understanding the image contrast of material boundaries in IR nanoscopy reaching 5 nm spatial resolution S Mastel, AA Govyadinov, C Maissen, A Chuvilin… - ACS Photonics, 2018
Switching of Current Rectification Ratios within a Single Nanocrystal by Facet-Resolved Electrical Wiring YB Vogel, J Zhang, N Darwish, S Ciampi - ACS nano, 2018
Measurement complex on the basis of AFM for investigating charge carrier distribution in semiconductor barrier structures DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - 2018 ELEKTRO, 2018
Terahertz Nano-imaging of graphene J Zhang, X Chen, S Mills, T Ciavatti, Z Yao, R Mescall… - ACS Photonics, 2018
Imaging on the Nanoscale with Terahertz Time-Domain and Emission Microscopy PK Pedersen, A Pizzuto, DM Mittleman - International Symposium on Ultrafast …, 2018
Bias Dependence of Laser Terahertz Emission Nanoscopy A Pizzuto, P Klarskov, DM Mittleman - CLEO: Science and Innovations, 2018
Comparisons of the topographic characteristics and electrical charge distributions among Babesia‐infected erythrocytes and extraerythrocytic merozoites using AFM L Scudiero, WDEJ MERCADO‐ROJANO, A Rudolph… - Journal of Microscopy, 2018
Random telegraph noise in 2D hexagonal boron nitride dielectric films A Ranjan, FM Puglisi, N Raghavan, SJ O'Shea… - Applied Physics Letters, 2018
Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman…2018
Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy CS Jiang, C Xiao, HR Moutinho, S Johnston… - Solar Energy, 2018
Resetting Piezoresponse Force Microscopy: Towards a real quantitative technique A Gomez, HTT Nong, S Mercone, T Puig, X Obradors - arXiv preprint arXiv …, 2017
Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman… Institute of Materials Research and Engineering, 2018
Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips A.Gomez T.Puig X.Obradors - Applied Surface Science Volume 439, 2018
Topological distribution of reversible and non-reversible degradation in perovskite solar cells A.Gomez S.Sanchez Mariano Campoy-Quiles A.Abate - Nano Energy Volume 45, 2018
Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy A. Gomez et al. , Nature Communications (2017), DOI: 10.1038/s41467-017-01361-2”
Direct Probing of Polarization Charge at Nanoscale Level O Kwon, D Seol, D Lee, H Han, I Lindfors‐Vrejoiu… - Advanced Materials, 2017
Optically Coupled Methods for Microwave Impedance Microscopy SR Johnston, EY Ma, ZX Shen - arXiv preprint arXiv:1710.10239, 2017
Self-templating faceted and spongy single-crystal ZnO nanorods: Resistive switching and enhanced piezoresponse A Quintana, A Gómez, MD Baró, S Suriñach, E Pellicer… - Materials & Design, 2017
Local investigation of capacitance-voltage characteristics of silicon solar cell with the modified surface DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - … Computing (MECO), 2017 …, 2017
Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires P Geydt, MS Dunaevskiy, E Lähderanta - Nanowires-New Insights, 2017
Nondestructive imaging of atomically thin nanostructures buried in silicon G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science Advances, 2017
Synthesis and characterization of Copper-nanocarbon films with enhanced stability RA Isaacs, HMI Jaim, DP Cole, K Gaskell, O Rabin… - Carbon, 2017
Structural and piezo-ferroelectric properties of K 0.5 Na 0.5 NbO 3 thin films grown by pulsed laser deposition and tested as sensors R Castañeda-Guzmán, R López-Juárez, JJ Gervacio… - Thin Solid Films, 2017
Ferroelectric and piezoelectric properties of Hf1-xZrxO2 and pure ZrO2 films S Starschich, T Schenk, U Schroeder, U Boettger - Applied Physics Letters, 2017
Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups M Lanza, U Celano, F Miao - Journal of Electroceramics, 2017
A non-volatile resistive memory effect in 2, 2', 6, 6'-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force … D Fichou, M Courte, S Surya, R Thamankar, C Shen… - RSC Advances, 2016
Lead-Free Piezoelectric (Ba, Ca)(Zr, Ti) O3 Thin Films for Biocompatible and Flexible Devices ND Scarisoreanu, FR Craciun, V Ion, R Birjega… - ACS Applied Materials & …, 2016
CdCl2 Treatment-Induced Enhanced Conductivity in CdTe Solar Cells Observed Using Conductive-Atomic Force Microscopy M Tuteja, AB Mei, V Palekis, A Hall, S MacLaren… - The Journal of Physical …, 2016
Diminish Electrostatic in Piezoresponse Force Microscopy through longer ultra-stiff tips A Gomez, M Coll, T Puig, X Obradors - arXiv preprint arXiv:1610.01809, 2016
A Solution‐Doped Polymer Semiconductor: Insulator Blend for Thermoelectrics D Kiefer, L Yu, E Fransson, A Gómez, D Primetzhofer… - Advanced Science, 2016
Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale S Hommel, N Killat, A Altes, T Schweinboeck… - Microelectronics Reliability, 2016
Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy A Gomez, M Gich, A Carretero-Genevrier, T Puig… - arXiv preprint arXiv: …, 2016
Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact MC Golt, KE Strawhecker, MS Bratcher, ER Shanholtz - Journal of Applied Physics, 2016
Mechanical properties and applications of custom-built gold AFM cantilevers VA Kolchuzhin, E Sheremet, K Bhattacharya… - Mechatronics, 2016
X ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells Chang et al; ACSnano.org, Vol8 No2 1584-1589 (2014)
Polarization dependent switching of asymmetric nanorings with a circular field Pradhan, Tuominen, and Aidala AIP Advances 6, 015302 (2016)
Near-field microwave microscopy of high-j oxides grown on graphene with an organic seeding layer Tselev et al; Appl. Phys. Lett. 103, 243105 (2013)
Manipulation of magnetization states of ferromagnetic nanorings by an applied azimuthal Oersted field Yang et al; Appl. Phys. Lett. 98, 242505 (2011)
Contrast distortion induced by modulation voltage in scanning capacitance microscopy Chang et al; Appl. Phys. Lett. 101, 083503 (2012)
Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extraction K. Wong and W. Chim Appl. Phys. Lett. 91, 013510 (2007)
Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy Gramse et al. Biophysical Journal 104(6) 1257–1262 (2013)
Ferroelectric behavior of bismuth titanate thin films grown via magnetron sputtering C.M. Bedoya-Hincapié et al. Ceramics International 40 11831–11836 (2014)
Mechanical properties and applications of custom-built gold AFM cantilevers V.A. Kolchuzhin et al. Mechatronics 0 0 0 1–6 (2016)
Measurement of Electron Transfer through Cytochrome P450 Protein on Nanopillars and the Effect of Bound Substrates Jett et al. J Am Chem Soc. 135(10) (2013)
Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact Golt et al. J. Appl. Phys. 120, 024302 (2016)
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites Wong et al. J. Appl. Phys. 103, 054505 (2008)
Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy Wood et al. J. Phys. Chem. C, 119, 11459−11467 (2015)
Interplay between Ferroelastic and Metal-Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2 Nanoplatelets Tselev et al Nano Lett. 10, 2003–2011 (2010)
Switching of ± 360° domain wall states in a nanoring by an azimuthal Oersted field Pradhan et al. Nanotechnology 22 485705 (4pp) (2011)
Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies G Gramse et al. Nanotechnology 24 415709 (2013)
Calibrated complex impedance and permittivity measurements with scanning microwave microscopy G Gramse et al Nanotechnology 25 145703 (2014)
Quantitative impedance characterization of sub-10nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope F Wang et al Nanotechnology 25 405703 F Wang (2014)
Quantitative sub-surface and non-contact imaging using scanning microwave microscopy G Gramse et al Nanotechnology 26 135701 (2015)
Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy S-S Tuca et al Nanotechnology 27 135702 (2016)
Charge gradient microscopy Hong et al. PNAS vol. 111 no. 18 6567 (2014)
An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements Dargent et al. Rev. Sci. Instrum. 84, 123705 (2013)
Electrical current through individual pairs of phosphorus donor atoms and silicon dangling bonds K. Ambal et al Scientific Reports 6:18531 (2016)
Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy Choi et al Scientific Reports 6:25087 (2016)
Rocky Mountain Nanotechnology: your only choice for ultra-sharp, solid platinum and platinum-iridium AFM probes
Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact and are ideal for C-AFM, EFM, KPFM PFM, SCM, SMM, SMIM, and SNOM applications.
Each probe is imaged by FE-SEM to verify its tip radius. The probes have cantilever frequencies from 4.5kHz up to 100kHz. They also have a long lifetime and high reliability in electrical measurements. There is never an issue with conductivity because the probe tips are purely metallic - as it wears, it remains fully conductive. It also has a long tip shank length, which reduces stray capacitance. Many users who perform electrical measurements order these probes regularly because of these benefits.
Documents and Files
M Dumitru-Grivei, V Ion, R Birjega, A Moldovan… - Applied Physics A, 2019
CM Efaw, T da Silva, PH Davis, L Li, E Graugnard… - Journal of The Electorchemical Society, 2019
D Abol-Fotouh, B Dörling, O Zapata-Arteaga… - Energy & Environmental …, 2019
J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby…2018
KJ Coakley, S Berweger, TM Wallis, P Kabos - Ultramicroscopy, 2018
P Klarskov, A Pizzuto, DM Mittleman - 2018 43rd International Conference on Infrared …, 2018
J Aprojanz, SR Power, P Bampoulis, S Roche… - Nature Communications, 2018
J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby… - 2018
S Mastel, AA Govyadinov, C Maissen, A Chuvilin… - ACS Photonics, 2018
YB Vogel, J Zhang, N Darwish, S Ciampi - ACS nano, 2018
DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - 2018 ELEKTRO, 2018
J Zhang, X Chen, S Mills, T Ciavatti, Z Yao, R Mescall… - ACS Photonics, 2018
PK Pedersen, A Pizzuto, DM Mittleman - International Symposium on Ultrafast …, 2018
A Pizzuto, P Klarskov, DM Mittleman - CLEO: Science and Innovations, 2018
L Scudiero, WDEJ MERCADO‐ROJANO, A Rudolph… - Journal of Microscopy, 2018
A Ranjan, FM Puglisi, N Raghavan, SJ O'Shea… - Applied Physics Letters, 2018
A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman…2018
CS Jiang, C Xiao, HR Moutinho, S Johnston… - Solar Energy, 2018
A Gomez, HTT Nong, S Mercone, T Puig, X Obradors - arXiv preprint arXiv …, 2017
A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman… Institute of Materials Research and Engineering, 2018
A.Gomez T.Puig X.Obradors - Applied Surface Science Volume 439, 2018
A.Gomez S.Sanchez Mariano Campoy-Quiles A.Abate - Nano Energy Volume 45, 2018
A. Gomez et al. , Nature Communications (2017), DOI: 10.1038/s41467-017-01361-2”
O Kwon, D Seol, D Lee, H Han, I Lindfors‐Vrejoiu… - Advanced Materials, 2017
SR Johnston, EY Ma, ZX Shen - arXiv preprint arXiv:1710.10239, 2017
A Quintana, A Gómez, MD Baró, S Suriñach, E Pellicer… - Materials & Design, 2017
DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - … Computing (MECO), 2017 …, 2017
P Geydt, MS Dunaevskiy, E Lähderanta - Nanowires-New Insights, 2017
G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science Advances, 2017
RA Isaacs, HMI Jaim, DP Cole, K Gaskell, O Rabin… - Carbon, 2017
R Castañeda-Guzmán, R López-Juárez, JJ Gervacio… - Thin Solid Films, 2017
S Starschich, T Schenk, U Schroeder, U Boettger - Applied Physics Letters, 2017
M Lanza, U Celano, F Miao - Journal of Electroceramics, 2017
D Fichou, M Courte, S Surya, R Thamankar, C Shen… - RSC Advances, 2016
ND Scarisoreanu, FR Craciun, V Ion, R Birjega… - ACS Applied Materials & …, 2016
M Tuteja, AB Mei, V Palekis, A Hall, S MacLaren… - The Journal of Physical …, 2016
A Gomez, M Coll, T Puig, X Obradors - arXiv preprint arXiv:1610.01809, 2016
D Kiefer, L Yu, E Fransson, A Gómez, D Primetzhofer… - Advanced Science, 2016
S Hommel, N Killat, A Altes, T Schweinboeck… - Microelectronics Reliability, 2016
A Gomez, M Gich, A Carretero-Genevrier, T Puig… - arXiv preprint arXiv: …, 2016
MC Golt, KE Strawhecker, MS Bratcher, ER Shanholtz - Journal of Applied Physics, 2016
VA Kolchuzhin, E Sheremet, K Bhattacharya… - Mechatronics, 2016
Chang et al; ACSnano.org, Vol8 No2 1584-1589 (2014)
Pradhan, Tuominen, and Aidala AIP Advances 6, 015302 (2016)
Tselev et al; Appl. Phys. Lett. 103, 243105 (2013)
Yang et al; Appl. Phys. Lett. 98, 242505 (2011)
Chang et al; Appl. Phys. Lett. 101, 083503 (2012)
K. Wong and W. Chim Appl. Phys. Lett. 91, 013510 (2007)
Gramse et al. Biophysical Journal 104(6) 1257–1262 (2013)
C.M. Bedoya-Hincapié et al. Ceramics International 40 11831–11836 (2014)
V.A. Kolchuzhin et al. Mechatronics 0 0 0 1–6 (2016)
Jett et al. J Am Chem Soc. 135(10) (2013)
Golt et al. J. Appl. Phys. 120, 024302 (2016)
Wong et al. J. Appl. Phys. 103, 054505 (2008)
Wood et al. J. Phys. Chem. C, 119, 11459−11467 (2015)
Tselev et al Nano Lett. 10, 2003–2011 (2010)
Pradhan et al. Nanotechnology 22 485705 (4pp) (2011)
G Gramse et al. Nanotechnology 24 415709 (2013)
G Gramse et al Nanotechnology 25 145703 (2014)
F Wang et al Nanotechnology 25 405703 F Wang (2014)
G Gramse et al Nanotechnology 26 135701 (2015)
S-S Tuca et al Nanotechnology 27 135702 (2016)
Hong et al. PNAS vol. 111 no. 18 6567 (2014)
Dargent et al. Rev. Sci. Instrum. 84, 123705 (2013)
K. Ambal et al Scientific Reports 6:18531 (2016)
Choi et al Scientific Reports 6:25087 (2016)
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