Platinum-Iridium high frequency AFM probes with prolonged mechanical wear
The 25PtIr200B-H is the updated version of RMN’s high frequency probe, with prolonged mechanical wear. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for SNOM and high Frequency applications.
- Tip shank length: 80 μm (± 25%)
- Cantilever length: 200 µm (± 15%)
- Cantilever width: 50 µm (± 15%)
- Spring constant: 290 N/m (± 40%)
- Frequency: 105 kHz (± 30%)
- Standard tip radii below 20 nm
- Tip radii below 10 nm on request - 25PtIr200B-H10
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Non - standard probe tips and cantilevers upon request