Rocky Mountain Nanotechnology: sonde AFM metalliche ultra affilate in platino e platino-iridio

Venerdì 31 Gennaio 2020
 Vista laterale di una sonda AFM RMN

Rocky Mountain Nanotechnology, LLC, è l'unica azienda che produce sonde AFM ultra affilate in platino e platino-iridio, per misurazioni elettriche ad alta risoluzione. Queste punte AFM possono essere utilizzate in varie modalità, tra cui tapping e contatto, e sono ideali per applicazioni C-AFM, EFM, KPFM PFM, SCM, SMM, SMIM e SNOM.

Ogni sonda viene fotografata con un FE-SEM per verificarne il raggio di punta. Le sonde hanno frequenze di cantilever da 4,5 kHz a 100 kHz. Possono contare su una lunga durata e un'alta affidabilità nelle misurazioni elettriche. Non si verifica alcun problema con la conduttività perché le punte della sonda sono puramente metalliche - anche quando iniziano a consumarsi rimangono del tutto conduttive. Ha anche una tip shank molto lunga, aspetto che permette di ridurre la capacità parassita. Molti utenti che eseguono misurazioni elettriche ordinano queste punte AFM regolarmente proprio per questi vantaggi.

Documenti e file 

AllegatoDimensione
PDF icon Flier Solid Pt and PtIr AFM Probes 29Jan20.pdf2.02 MB
Pubblicazioni
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    D Abol-Fotouh, B Dörling, O Zapata-Arteaga… - Energy & Environmental …, 2019
 
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    P Klarskov, A Pizzuto, DM Mittleman - 2018 43rd International Conference on Infrared …, 2018
 
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    J Aprojanz, SR Power, P Bampoulis, S Roche… - Nature Communications, 2018
 
  • Synthesis of Phosphonic Acid Ligands for Nanocrystal Surface Functionalization and Solution Processed Memristors
    J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby… - 2018
 
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    ​S Mastel, AA Govyadinov, C Maissen, A Chuvilin… - ACS Photonics, 2018
 
  • Switching of Current Rectification Ratios within a Single Nanocrystal by Facet-Resolved Electrical Wiring
    ​YB Vogel, J Zhang, N Darwish, S Ciampi - ACS nano, 2018
 
  • Measurement complex on the basis of AFM for investigating charge carrier distribution in semiconductor barrier structures
    DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - 2018 ELEKTRO, 2018
 
  • Terahertz Nano-imaging of graphene
    J Zhang, X Chen, S Mills, T Ciavatti, Z Yao, R Mescall… - ACS Photonics, 2018
 
  • Imaging on the Nanoscale with Terahertz Time-Domain and Emission Microscopy
    PK Pedersen, A Pizzuto, DM Mittleman - International Symposium on Ultrafast …, 2018
 
  • Bias Dependence of Laser Terahertz Emission Nanoscopy
    A Pizzuto, P Klarskov, DM Mittleman - CLEO: Science and Innovations, 2018
 
  • Comparisons of the topographic characteristics and electrical charge distributions among Babesia‐infected erythrocytes and extraerythrocytic merozoites using AFM
    L Scudiero, WDEJ MERCADO‐ROJANO, A Rudolph… - Journal of Microscopy, 2018
 
  • Random telegraph noise in 2D hexagonal boron nitride dielectric films
    A Ranjan, FM Puglisi, N Raghavan, SJ O'Shea… - Applied Physics Letters, 2018
 
  • Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics
    A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman…2018
 
  • Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy
    CS Jiang, C Xiao, HR Moutinho, S Johnston… - Solar Energy, 2018
 
  • Resetting Piezoresponse Force Microscopy: Towards a real quantitative technique
    A Gomez, HTT Nong, S Mercone, T Puig, X Obradors - arXiv preprint arXiv …, 2017
 
  • Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics
    A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman… Institute of Materials Research and Engineering, 2018
 
  • Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips
    A.Gomez T.Puig X.Obradors - Applied Surface Science Volume 439, 2018
 
  • Topological distribution of reversible and non-reversible degradation in perovskite solar cells
    A.Gomez S.Sanchez Mariano Campoy-Quiles A.Abate - Nano Energy Volume 45, 2018
 
  • Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy
    A. Gomez et al. , Nature Communications (2017), DOI: 10.1038/s41467-017-01361-2”
 
  • Direct Probing of Polarization Charge at Nanoscale Level
    O Kwon, D Seol, D Lee, H Han, I Lindfors‐Vrejoiu… - Advanced Materials, 2017
 
  • Optically Coupled Methods for Microwave Impedance Microscopy
    SR Johnston, EY Ma, ZX Shen - arXiv preprint arXiv:1710.10239, 2017
 
  • Self-templating faceted and spongy single-crystal ZnO nanorods: Resistive switching and enhanced piezoresponse
    A Quintana, A Gómez, MD Baró, S Suriñach, E Pellicer… - Materials & Design, 2017
 
  • Local investigation of capacitance-voltage characteristics of silicon solar cell with the modified surface
    DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - … Computing (MECO), 2017 …, 2017
 
  • Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
    P Geydt, MS Dunaevskiy, E Lähderanta - Nanowires-New Insights, 2017
 
  • Nondestructive imaging of atomically thin nanostructures buried in silicon
    G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science Advances, 2017
 
  • Synthesis and characterization of Copper-nanocarbon films with enhanced stability
    RA Isaacs, HMI Jaim, DP Cole, K Gaskell, O Rabin… - Carbon, 2017
 
  • Structural and piezo-ferroelectric properties of K 0.5 Na 0.5 NbO 3 thin films grown by pulsed laser deposition and tested as sensors
    R Castañeda-Guzmán, R López-Juárez, JJ Gervacio… - Thin Solid Films, 2017
 
  • Ferroelectric and piezoelectric properties of Hf1-xZrxO2 and pure ZrO2 films
    S Starschich, T Schenk, U Schroeder, U Boettger - Applied Physics Letters, 2017
 
  • Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
    M Lanza, U Celano, F Miao - Journal of Electroceramics, 2017
 
  • A non-volatile resistive memory effect in 2, 2', 6, 6'-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force …
    D Fichou, M Courte, S Surya, R Thamankar, C Shen… - RSC Advances, 2016
 
  • Lead-Free Piezoelectric (Ba, Ca)(Zr, Ti) O3 Thin Films for Biocompatible and Flexible Devices
    ND Scarisoreanu, FR Craciun, V Ion, R Birjega… - ACS Applied Materials & …, 2016
 
  • CdCl2 Treatment-Induced Enhanced Conductivity in CdTe Solar Cells Observed Using Conductive-Atomic Force Microscopy
    M Tuteja, AB Mei, V Palekis, A Hall, S MacLaren… - The Journal of Physical …, 2016
 
  • Diminish Electrostatic in Piezoresponse Force Microscopy through longer ultra-stiff tips
    A Gomez, M Coll, T Puig, X Obradors - arXiv preprint arXiv:1610.01809, 2016
 
  • A Solution‐Doped Polymer Semiconductor: Insulator Blend for Thermoelectrics
    D Kiefer, L Yu, E Fransson, A Gómez, D Primetzhofer… - Advanced Science, 2016
 
  • Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale
    S Hommel, N Killat, A Altes, T Schweinboeck… - Microelectronics Reliability, 2016
 
  • Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy
    A Gomez, M Gich, A Carretero-Genevrier, T Puig… - arXiv preprint arXiv: …, 2016
 
  • Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact
    MC Golt, KE Strawhecker, MS Bratcher, ER Shanholtz - Journal of Applied Physics, 2016
 
  • Mechanical properties and applications of custom-built gold AFM cantilevers
    VA Kolchuzhin, E Sheremet, K Bhattacharya… - Mechatronics, 2016
 
  • X ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells
    Chang et al; ACSnano.org, Vol8 No2 1584-1589 (2014)
 
  • Polarization dependent switching of asymmetric nanorings with a circular field
    Pradhan, Tuominen, and Aidala AIP Advances 6, 015302 (2016)
 
  • Near-field microwave microscopy of high-j oxides grown on graphene with an organic seeding layer
    Tselev et al; Appl. Phys. Lett. 103, 243105 (2013)
 
  • Manipulation of magnetization states of ferromagnetic nanorings by an applied azimuthal Oersted field
    Yang et al; Appl. Phys. Lett. 98, 242505 (2011)
 
  • Contrast distortion induced by modulation voltage in scanning capacitance microscopy
    Chang et al; Appl. Phys. Lett. 101, 083503 (2012)
 
  • Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extraction
    K. Wong and W. Chim Appl. Phys. Lett. 91, 013510 (2007)
 
  • Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy
    Gramse et al. Biophysical Journal 104(6) 1257–1262 (2013)
 
  • Ferroelectric behavior of bismuth titanate thin films grown via magnetron sputtering
    C.M. Bedoya-Hincapié et al. Ceramics International 40 11831–11836 (2014)
 
  • Mechanical properties and applications of custom-built gold AFM cantilevers
    V.A. Kolchuzhin et al. Mechatronics 0 0 0 1–6 (2016)
 
  • Measurement of Electron Transfer through Cytochrome P450 Protein on Nanopillars and the Effect of Bound Substrates
    Jett et al. J Am Chem Soc. 135(10) (2013)
 
  • Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact
    Golt et al. J. Appl. Phys. 120, 024302 (2016)
 
  • Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
    Wong et al. J. Appl. Phys. 103, 054505 (2008)
 
  • Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy
    Wood et al. J. Phys. Chem. C, 119, 11459−11467 (2015)
 
  • Interplay between Ferroelastic and Metal-Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2 Nanoplatelets
    Tselev et al Nano Lett. 10, 2003–2011 (2010)
 
  • Switching of ± 360° domain wall states in a nanoring by an azimuthal Oersted field
    Pradhan et al. Nanotechnology 22 485705 (4pp) (2011)
 
  • Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies
    G Gramse et al. Nanotechnology 24 415709 (2013)
 
  • Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
    G Gramse et al Nanotechnology 25 145703 (2014)
 
  • Quantitative impedance characterization of sub-10nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
    F Wang et al Nanotechnology 25 405703 F Wang (2014)
 
  • Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
    G Gramse et al Nanotechnology 26 135701 (2015)
 
  • Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy
    S-S Tuca et al Nanotechnology 27 135702 (2016)
 
  • Charge gradient microscopy
    Hong et al. PNAS vol. 111 no. 18 6567 (2014)
 
  • An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
    Dargent et al. Rev. Sci. Instrum. 84, 123705 (2013)
 
  • Electrical current through individual pairs of phosphorus donor atoms and silicon dangling bonds
    K. Ambal et al Scientific Reports 6:18531 (2016)
 
  • Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy
    Choi et al Scientific Reports 6:25087 (2016)

Prodotti correlati 

Le sonde RMNano con la più bassa costante elastica: 0.3 N/m (± 40%)
12Pt400B
Modello con alto valore di costante elastica per modalità AFM a contatto
Sonda AFM in platino-iridio con la costante elastica più bassa
12PtIr400B o 12PtIr400A -  Sonda AFM in platino-iridio con la costante elastica più bassa
La sonda più versatile: un'ottima scelta per diverse applicazioni
25Pt300B
Sonda versatile con bassa costante elastica: 8 N / m (± 40%)
La sonda RMN ad alta costante eslastica: 250 N / m (± 40%)
Punte AFM in Platino-Iridio con usura meccanica prolungata
25PtIr300B o 25PtIr300A - Punte AFM in Platino-Iridio con usura meccanica prolungata
Sonde AFM in Platino-Iridio ad alta frequenza con usura meccanica prolungata
25PtIr300B or 25PtIr300A - Sonde AFM in Platino-Iridio ad alta frequenza con usura meccanica prolungata