Rocky Mountain Nanotechnology: your only choice for ultra-sharp, solid platinum and platinum-iridium AFM probes

Side view of an RMN AFM probe
Post publication date: 
Friday, January 31, 2020
Contact us for more info

Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact and are ideal for C-AFM, EFM, KPFM PFM, SCM, SMM, SMIM,  and SNOM applications.

Each probe is imaged by FE-SEM to verify its tip radius. The probes have cantilever frequencies from 4.5kHz up to 100kHz. They also have a long lifetime and high reliability in electrical measurements. There is never an issue with conductivity because the probe tips are purely metallic - as it wears, it remains fully conductive. It also has a long tip shank length, which reduces stray capacitance.  Many users who perform electrical measurements order these probes regularly because of these benefits.

Documents and Files 

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Publications
  • ​Multiferroic (Nd, Fe)-doped PbTiO 3 thin films obtained by pulsed laser deposition
    M Dumitru-Grivei, V Ion, R Birjega, A Moldovan… - Applied Physics A, 2019
 
  • Toward Improving Ambient Volta Potential Measurements with SKPFM for Corrosion Studies
    CM Efaw, T da Silva, PH Davis, L Li, E Graugnard… - Journal of The Electorchemical Society, 2019
 
  • Farming thermoelectric paper
    D Abol-Fotouh, B Dörling, O Zapata-Arteaga… - Energy & Environmental …, 2019
 
  • Supporting information for Synthesis of phosphonic acid ligands for nanocrystal surface functionalization and solution processed memristors
    J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby…2018
 
  • Disentangling Topographic Contributions to Near-field Scanning Microwave Microscopy Images
    KJ Coakley, S Berweger, TM Wallis, P Kabos - Ultramicroscopy, 2018
 
  • Imaging on the Nanoscale with THz Time-Domain, Emission and Pump-Probe Microscopy
    P Klarskov, A Pizzuto, DM Mittleman - 2018 43rd International Conference on Infrared …, 2018
 
  • Ballistic tracks in graphene nanoribbons
    J Aprojanz, SR Power, P Bampoulis, S Roche… - Nature Communications, 2018
 
  • Synthesis of Phosphonic Acid Ligands for Nanocrystal Surface Functionalization and Solution Processed Memristors
    J De Roo, Z Zhou, J Wang, L Deblock, AJ Crosby… - 2018
 
  • Understanding the image contrast of material boundaries in IR nanoscopy reaching 5 nm spatial resolution
    ​S Mastel, AA Govyadinov, C Maissen, A Chuvilin… - ACS Photonics, 2018
 
  • Switching of Current Rectification Ratios within a Single Nanocrystal by Facet-Resolved Electrical Wiring
    ​YB Vogel, J Zhang, N Darwish, S Ciampi - ACS nano, 2018
 
  • Measurement complex on the basis of AFM for investigating charge carrier distribution in semiconductor barrier structures
    DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - 2018 ELEKTRO, 2018
 
  • Terahertz Nano-imaging of graphene
    J Zhang, X Chen, S Mills, T Ciavatti, Z Yao, R Mescall… - ACS Photonics, 2018
 
  • Imaging on the Nanoscale with Terahertz Time-Domain and Emission Microscopy
    PK Pedersen, A Pizzuto, DM Mittleman - International Symposium on Ultrafast …, 2018
 
  • Bias Dependence of Laser Terahertz Emission Nanoscopy
    A Pizzuto, P Klarskov, DM Mittleman - CLEO: Science and Innovations, 2018
 
  • Comparisons of the topographic characteristics and electrical charge distributions among Babesia‐infected erythrocytes and extraerythrocytic merozoites using AFM
    L Scudiero, WDEJ MERCADO‐ROJANO, A Rudolph… - Journal of Microscopy, 2018
 
  • Random telegraph noise in 2D hexagonal boron nitride dielectric films
    A Ranjan, FM Puglisi, N Raghavan, SJ O'Shea… - Applied Physics Letters, 2018
 
  • Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics
    A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman…2018
 
  • Imaging charge carriers in potential-induced degradation defects of c-Si solar cells by scanning capacitance microscopy
    CS Jiang, C Xiao, HR Moutinho, S Johnston… - Solar Energy, 2018
 
  • Resetting Piezoresponse Force Microscopy: Towards a real quantitative technique
    A Gomez, HTT Nong, S Mercone, T Puig, X Obradors - arXiv preprint arXiv …, 2017
 
  • Mechanism of Soft and Hard Breakdown in Hexagonal Boron Nitride 2D Dielectrics
    A Ranjan, N Raghavan, SJ O'Shea, S Mei, M Bosman… Institute of Materials Research and Engineering, 2018
 
  • Diminish electrostatic in piezoresponse force microscopy through longer or ultra-stiff tips
    A.Gomez T.Puig X.Obradors - Applied Surface Science Volume 439, 2018
 
  • Topological distribution of reversible and non-reversible degradation in perovskite solar cells
    A.Gomez S.Sanchez Mariano Campoy-Quiles A.Abate - Nano Energy Volume 45, 2018
 
  • Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy
    A. Gomez et al. , Nature Communications (2017), DOI: 10.1038/s41467-017-01361-2”
 
  • Direct Probing of Polarization Charge at Nanoscale Level
    O Kwon, D Seol, D Lee, H Han, I Lindfors‐Vrejoiu… - Advanced Materials, 2017
 
  • Optically Coupled Methods for Microwave Impedance Microscopy
    SR Johnston, EY Ma, ZX Shen - arXiv preprint arXiv:1710.10239, 2017
 
  • Self-templating faceted and spongy single-crystal ZnO nanorods: Resistive switching and enhanced piezoresponse
    A Quintana, A Gómez, MD Baró, S Suriñach, E Pellicer… - Materials & Design, 2017
 
  • Local investigation of capacitance-voltage characteristics of silicon solar cell with the modified surface
    DS Kusakin, VG Litvinov, NB Rybin, AV Ermachikhin… - … Computing (MECO), 2017 …, 2017
 
  • Opportunities of Scanning Probe Microscopy for Electrical, Mechanical and Electromechanical Research of Semiconductor Nanowires
    P Geydt, MS Dunaevskiy, E Lähderanta - Nanowires-New Insights, 2017
 
  • Nondestructive imaging of atomically thin nanostructures buried in silicon
    G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki… - Science Advances, 2017
 
  • Synthesis and characterization of Copper-nanocarbon films with enhanced stability
    RA Isaacs, HMI Jaim, DP Cole, K Gaskell, O Rabin… - Carbon, 2017
 
  • Structural and piezo-ferroelectric properties of K 0.5 Na 0.5 NbO 3 thin films grown by pulsed laser deposition and tested as sensors
    R Castañeda-Guzmán, R López-Juárez, JJ Gervacio… - Thin Solid Films, 2017
 
  • Ferroelectric and piezoelectric properties of Hf1-xZrxO2 and pure ZrO2 films
    S Starschich, T Schenk, U Schroeder, U Boettger - Applied Physics Letters, 2017
 
  • Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
    M Lanza, U Celano, F Miao - Journal of Electroceramics, 2017
 
  • A non-volatile resistive memory effect in 2, 2', 6, 6'-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force …
    D Fichou, M Courte, S Surya, R Thamankar, C Shen… - RSC Advances, 2016
 
  • Lead-Free Piezoelectric (Ba, Ca)(Zr, Ti) O3 Thin Films for Biocompatible and Flexible Devices
    ND Scarisoreanu, FR Craciun, V Ion, R Birjega… - ACS Applied Materials & …, 2016
 
  • CdCl2 Treatment-Induced Enhanced Conductivity in CdTe Solar Cells Observed Using Conductive-Atomic Force Microscopy
    M Tuteja, AB Mei, V Palekis, A Hall, S MacLaren… - The Journal of Physical …, 2016
 
  • Diminish Electrostatic in Piezoresponse Force Microscopy through longer ultra-stiff tips
    A Gomez, M Coll, T Puig, X Obradors - arXiv preprint arXiv:1610.01809, 2016
 
  • A Solution‐Doped Polymer Semiconductor: Insulator Blend for Thermoelectrics
    D Kiefer, L Yu, E Fransson, A Gómez, D Primetzhofer… - Advanced Science, 2016
 
  • Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre Scale
    S Hommel, N Killat, A Altes, T Schweinboeck… - Microelectronics Reliability, 2016
 
  • Piezo-generated charge mapping revealed through Direct Piezoelectric Force Microscopy
    A Gomez, M Gich, A Carretero-Genevrier, T Puig… - arXiv preprint arXiv: …, 2016
 
  • Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact
    MC Golt, KE Strawhecker, MS Bratcher, ER Shanholtz - Journal of Applied Physics, 2016
 
  • Mechanical properties and applications of custom-built gold AFM cantilevers
    VA Kolchuzhin, E Sheremet, K Bhattacharya… - Mechatronics, 2016
 
  • X ray Irradiation Induced Reversible Resistance Change in Pt/TiO2/Pt Cells
    Chang et al; ACSnano.org, Vol8 No2 1584-1589 (2014)
 
  • Polarization dependent switching of asymmetric nanorings with a circular field
    Pradhan, Tuominen, and Aidala AIP Advances 6, 015302 (2016)
 
  • Near-field microwave microscopy of high-j oxides grown on graphene with an organic seeding layer
    Tselev et al; Appl. Phys. Lett. 103, 243105 (2013)
 
  • Manipulation of magnetization states of ferromagnetic nanorings by an applied azimuthal Oersted field
    Yang et al; Appl. Phys. Lett. 98, 242505 (2011)
 
  • Contrast distortion induced by modulation voltage in scanning capacitance microscopy
    Chang et al; Appl. Phys. Lett. 101, 083503 (2012)
 
  • Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extraction
    K. Wong and W. Chim Appl. Phys. Lett. 91, 013510 (2007)
 
  • Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy
    Gramse et al. Biophysical Journal 104(6) 1257–1262 (2013)
 
  • Ferroelectric behavior of bismuth titanate thin films grown via magnetron sputtering
    C.M. Bedoya-Hincapié et al. Ceramics International 40 11831–11836 (2014)
 
  • Mechanical properties and applications of custom-built gold AFM cantilevers
    V.A. Kolchuzhin et al. Mechatronics 0 0 0 1–6 (2016)
 
  • Measurement of Electron Transfer through Cytochrome P450 Protein on Nanopillars and the Effect of Bound Substrates
    Jett et al. J Am Chem Soc. 135(10) (2013)
 
  • Polycrystalline silicon carbide dopant profiles obtained through a scanning nano-Schottky contact
    Golt et al. J. Appl. Phys. 120, 024302 (2016)
 
  • Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
    Wong et al. J. Appl. Phys. 103, 054505 (2008)
 
  • Quantitative Nanoscale Mapping with Temperature Dependence of the Mechanical and Electrical Properties of Poly(3-hexylthiophene) by Conductive Atomic Force Microscopy
    Wood et al. J. Phys. Chem. C, 119, 11459−11467 (2015)
 
  • Interplay between Ferroelastic and Metal-Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2 Nanoplatelets
    Tselev et al Nano Lett. 10, 2003–2011 (2010)
 
  • Switching of ± 360° domain wall states in a nanoring by an azimuthal Oersted field
    Pradhan et al. Nanotechnology 22 485705 (4pp) (2011)
 
  • Theory of amplitude modulated electrostatic force microscopy for dielectric measurements in liquids at MHz frequencies
    G Gramse et al. Nanotechnology 24 415709 (2013)
 
  • Calibrated complex impedance and permittivity measurements with scanning microwave microscopy
    G Gramse et al Nanotechnology 25 145703 (2014)
 
  • Quantitative impedance characterization of sub-10nm scale capacitors and tunnel junctions with an interferometric scanning microwave microscope
    F Wang et al Nanotechnology 25 405703 F Wang (2014)
 
  • Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
    G Gramse et al Nanotechnology 26 135701 (2015)
 
  • Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy
    S-S Tuca et al Nanotechnology 27 135702 (2016)
 
  • Charge gradient microscopy
    Hong et al. PNAS vol. 111 no. 18 6567 (2014)
 
  • An interferometric scanning microwave microscope and calibration method for sub-fF microwave measurements
    Dargent et al. Rev. Sci. Instrum. 84, 123705 (2013)
 
  • Electrical current through individual pairs of phosphorus donor atoms and silicon dangling bonds
    K. Ambal et al Scientific Reports 6:18531 (2016)
 
  • Charge collection kinetics on ferroelectric polymer surface using charge gradient microscopy
    Choi et al Scientific Reports 6:25087 (2016)

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Rocky Mountain Nanotechnology

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Solid metallic AFM probe tips for SCM and C-AFM

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3D imaging
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AFM microscopy
AFM Probes
scanning probe microscopy
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