September 16, 09:30 – 12:00 (GMT/UTC +2)
Don't miss the chance to showcase your FluidFM-related applications, results and experiences to the FluidFM community.
Submission deadline: July 31, 2020
Schaefer's Blog
Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.
Last News
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Latest News
Friday, August 22, 2025
Schaefer at ESB 2025 in Turin – Bioprinting and Biotechnology
Schaefer will be present with its own booth at the 2025 edition of the ESB – European Society for Biomaterials Congress, which will take place in Turin from 7 to 11 September.
During the...
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Latest News
Friday, August 15, 2025
Schaefer at the 17th Multinational Congress on Microscopy (17MCM) in Slovenia with the Nanos Bench-top SEM
Schaefer will participate in the 17th Multinational Congress on Microscopy (17MCM), which will be held from 7 to 12 September 2025 in Portorož,...
Schaefer at the 17th Multinational Congress on Microscopy (17MCM) in Slovenia with the Nanos Bench-top SEM -
Latest News
Friday, July 25, 2025
Synthetic Diamond: New Frontier in Power Electronics. Why Nanometer-Scale Metrology is Critical to Avoid Growth Defects
Synthetic diamond is shaping the future of renewable energy and power electronics....
Synthetic Diamond: New Frontier in Power Electronics. Why Nanometer-Scale Metrology is Critical to Avoid Growth Defects -
Latest News
Monday, July 14, 2025
From Plasma to Pathology: A Robust Workflow for EV Isolation and Quantification
We’re excited to share a recent scientific highlight from our partner Izon Science, a global leader in extracellular vesicle (EV) isolation and...
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Latest News
Wednesday, June 18, 2025
DVIA-ML Series: Vibration Isolation for Optimal Electron Microscope Imaging
DAEIL SYSTEMS’ DVIA-ML Series is a highly advanced vibration isolation system designed to optimize the imaging performance of electron microscopes, leveraging...
Friday, July 24, 2020
Tuesday, July 21, 2020
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
Monday, July 6, 2020
Join us on July 15th for a live webinar!
Prof. Samiul Amin (Manhattan College) will be presenting new applications of DWS optical microrheology in cosmetic formulations. The microstructure of surfactant/biosurfactant systems and its characterization through high frequency...
Wednesday, June 24, 2020
Webinar's key topics:
- Advanced CSI AFM Modes – Electrical measurements
- HD-KFM mode : Concept, advantages and exemples
- Most advanced single-pass KFM mode (no lift)
- Much higher sensitivity & resolution
Monday, June 22, 2020
ISO 25178 is considered one of the main milestones in the characterization of 3D areal surface texture. It is based on the principle that nature is inherently three-dimensional. Thus, it is the...