Profilometers

The new S neox outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with a class-leading areal measurement system.

You can watch and download the presentation webinar of the new S neox run...

The Digital Holographic Camera is a cost-effective module that can readily be attached to the side port of your fluorescence microscope. It allows to easily obtain phase images from a standard fluorescence microscope with a simple module addition.

The Reflection DHM series (DHM®-R1000, DHM®-R2100 and DHM®-R2200) are reflection configured holographic microscopes. They are ideal for measuring totally and partially reflecting objects. Their ability to work with low reflective interfaces (down to less than 1...

The Lens-less sensor is a fixed field of view DHM®, this unique patented design is robust and ideal for industrial applications. The reflection configuration measures 3D topography with a sub-nanometric resolution.

Digital holography offers significant advantages compare to others 3D...

3D surface sensor optimized for in-line and mobile use requiring high performance in harsh environments with extremely short cycle times.

• FAST - Cycle times below 1 second possible
• ROBUST - optimized for inline applications

Operation without vibration...

S lynx is a new high-resolution non-contact 3D surface profiler in a more compact format. This system draws on over 14 years of experience in designing optical metrology systems for both R&D and industry, enabling Sensofar to pack all the performance of Sensofar's S line of high-end 3D...

Classical optical microscopes can be expanded into a fullfledged 3-D surface instrument, significantly increasing their usefulness. Using this measurement principle high-precision 3-D data can be collected throughout the viewable range of the microscope. Various types of 3-D analyses can then be...

The P-17 offers industry leading measurement repeatability for reliable measurement performance.  The system has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching.  The UltraLite® sensor includes dynamic force...

The MicroXAM-1200 3D non-contact profilometer is a surface characterization solution for a wide range of applications and industries - from R&D departments, universities, and commercial labs to production monitoring and process control in IC manufacturing and data storage. The non-contact...

The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6...

The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8Ã… (1 sigma) or 0.1%...

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured...

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button acquisition.

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