Profilometers

The Digital Holographic Camera is a cost-effective module that can readily be attached to the side port of your fluorescence microscope. It allows to easily obtain phase images from a standard fluorescence microscope with a simple module addition.

The first macroscopic configuration of reflection DHM®. It enables measurement of 3D topography with large field of view up to 32 x 32 mm. As others DHM® products, the macro-sensor is a non-scanning instruments recording 3D topography at unrivaled acquisition speed.

This new patented...

The Five Axis 3D optical profiler combines a high-accuracy rotational module with advanced inspection and analysis capabilities. This enables automatic 3D surface measurements at defined positions which combine to create full 3D volumetric measurements. Three measurement technologies cover a...

Classical optical microscopes can be expanded into a fullfledged 3-D surface instrument, significantly increasing their usefulness. Using this measurement principle high-precision 3-D data can be collected throughout the viewable range of the microscope. Various types of 3-D analyses can then be...

The S mart is the culmination of more than 14 years of experience in the development of surface metrology systems. It was designed right from the initial conception to be integrated into production systems and to withstand harsh environments. Being compact, lightweight, and with flexible...

The smartWLI-prime optical surface measuring device allows users to measure and analyse samples with nanometer resolution. Data analysis is then done in situ on a laptop or desktop computer.
The smartWLI-prime can be used in many different situations because of its compact size. Typical...

The P-17 offers industry leading measurement repeatability for reliable measurement performance.  The system has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching.  The UltraLite® sensor includes dynamic force...

The MicroXAM-1200 3D non-contact profilometer is a surface characterization solution for a wide range of applications and industries - from R&D departments, universities, and commercial labs to production monitoring and process control in IC manufacturing and data storage. The non-contact...

The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6...

The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8Ã… (1 sigma) or 0.1%...

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured...