3D imaging

All the articles in our blog about 3D imaging

Friday, February 16, 2024
Galaxy Dual for Multimode and new AFM Nano-Observer II - Roadshow in Italy - 18th - 22th March 2024

CSI and Schaefer SEE are organizing a demo tour in Italy to present the Galaxy Dual for Multimode and the AFM Nano-Observer II.

Give your AFM a second life: the Galaxy Dual Controller renews and improves the performance of your AFM with...

Sunday, November 26, 2023
 Explore TomoAnalysis - Holotomography Image Analysis Software

With great enthusiasm, we invite you to an upcoming webinar dedicated to introducing Tomocube's latest innovation: TomoAnalysis v1.7.
TomoAnalysis is a holotomography image analysis software that provides a range of customizable procedures of analysis pipelines to address diverse user needs...

Monday, May 22, 2023
Webinar Sensofar profilometry metrology: The Art of Measuring Super Smooth Surfaces

Are you interested in mastering the characterization of super smooth surfaces?

Super smooth surfaces are crucial in various industries, ensuring top-notch performance and accuracy. From aerospace and automotiv...

Wednesday, February 8, 2023
How to Choose the Right AFM Probes for Your Application

Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.

Even for an experienced AFM user, choosing the right probe can be daunting. Using an...

Monday, January 16, 2023
 The Future of Quantitative PFM

Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...

Friday, November 18, 2022
New Accessory for Jupiter XR AFM: nanoTDDB

Nuovo accessorio per il Jupiter XR AFM: nanoTDDB

Abstract

In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...

Wednesday, November 16, 2022
34th AICC ANNUAL CONFERENCE – Organoids models of human diseases

Aula Bottazzi - Università della Campania - Sant'Andrea delle Dame - Via L. De Crecchio 7, 80138 Napoli

CONFERENCE AIMS
Organoid technology currently represents a fundamental tool for both basic and translational research.
Their potential to faithfully recapitulate human disease is the key for biomedical research in the present and in a near future.
The aim of this...

Thursday, September 15, 2022
Epifluorescence of PVDF and PLA stained with Nile red in Aurelia sp. ephyrae jellyfish acquired together with holotomogram.

Epifluorescenza di PVDF e PLA colorato con rosso Nilo in Aurelia sp. meduse ephyrae acquisite insieme all'olotomogramma. Entrambi i materiali (colore rosso che rappresenta il canale di fluorescenza; indice di rifrazione 1,42 per PVDF e 1,4 per PLA) sono localizzati all'interno del corpo gelatinoso (intervallo di indice 1,355–1,378) dopo 24 ore di esposizione. Le barre equivalgono a 30 μm.

A new article has just been released: it is the result of the activity done in November 2021, a collaboration with CNR-ISMAR (Genoa UOS) and Schaefer South-East Europe, in which the Tomocube HT-2H has been used to do holotomographic imaging on the samples.

...
Thursday, August 25, 2022

In this webinar, a few of the features available in the MountainsSpectral® software (by Digital Surf) will be showed. The webinar is aimed at current users of the software, anyone trying out the software and, more widely, at anyone working with data from spectroscopic techniques or performing...

Thursday, July 21, 2022
Tomocube launches World’s First High-Resolution Holotomography Microscope with an Incoherent Light Source

Ground-breaking technology unlocks label-free 3D and 4D live cell imaging on standard imaging plates for higher-throughput and automated screening applications

A novel optical microscope utilizing incoherent light to generate holographic images of unlabelled live cells...

Monday, June 6, 2022

Full field vibration mode shape and transient analysis

  • Non-Scanning MEMS Analyzer
  • Million-data-points vibration maps
  • Picometer vibration resolution
  • In- and out-of-plane up to 25Mhz...
Wednesday, March 16, 2022
Three-dimensional refractive index and phase map of P. knowlesi-infected RBCs.

Alterations in Plasmodium knowlesi-infected red blood cells were studied using TOMOCUBE, INC.'s HT-1H, published in BMC Parasites & Vectors.

From...

Wednesday, September 29, 2021
October 4-9, 2021 - EMO MILANO 2021

October 4-9, 2021 - The most awaited European meeting of the year for the manufacturing industry is taking place!

Sensofar ansd Schaefer will be there, featuring the latest systems!

All attendees who visit us will have the opportunity to see a live...

Tuesday, September 28, 2021
30/09/2021 - WebinarTomocube sull'olotomografia:

Polyhydroxyalkanoates (PHAs) are biodegradable polyesters accumulated in the form of insoluble granules within some microorganisms and considered sustainable and environmentally friendly substitutes for petroleum-based plastics. Despite great advances in PHA research, ...

Wednesday, May 19, 2021
Webinar - How 3D Non-contact Surface measurement can improve your Additive Manufacturing process

Thursday, 3th June:

  • 10 A.M. CEST time 
  • 6 P.M. CEST time

Additive Manufacturing has quickly become an acceptable process within many areas of manufacturing.

Complex designs with improved functionality are easily produced using additive...

Thursday, April 29, 2021
May 3, 2021 - Tomocube Holotomography Webinar: Platelet research using HT

The webinar recording is available.

Until now, platelet imaging was limited to mainly focusing on morphology. Tomocube's Holotomography (HT) technology brings a new perspective to platelet research by providing not only three-dimensional images of platelets, but also...

Tuesday, April 20, 2021
3d Profiler flagship system S neox from Sensofar

Sensofar S neox

Sensofar has substantially improved the performance of the S neox, adding important upgrades concerning process automation, usability and automation of the system. The system validation package, ensuring compliance with all standards and protocols, has also been improved.
The new features...

Thursday, February 25, 2021
Photomask Repair - Adama Innovations atomically sharp and ultra-strong tips

New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!

  1. Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Monday, January 18, 2021
Seeing LLPS (liquid liquid phase separation) with holotomography

Many researchers were interested in seeing LLPS (liquid liquid phase separation) with holotomography.
We introduce LLPS observed by Tomocube's HT in a publication by Choi et. al. - "Aggresomal sequestration and STUB1-mediated ubiquitylation during mammalian proteaphagy of inhibited...

Monday, January 11, 2021
Sources of Vibration in a Lab

We're the distributors of Daeil Systems instruments. Daeil is a korean company that supplies a wide range of vibration isolation systems, including thousands of optical tables, from passive to active isolation systems. Customers are industries,...

Tuesday, October 20, 2020
The poster-document to be used along with the S neox

Due to the complexity involving optical surface metrology, Sensofar has developed a poster-document that will help you understand all the points and steps to follow in the measurement process with the ...

Wednesday, August 5, 2020
Webinar August 19, 2020: Characterization of two-dimensional materials with atomic force microscopy

Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...

Tuesday, July 21, 2020
Webinar - Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy

Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST

Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...

Monday, June 22, 2020
Webinar - ISO 25178: Surface Texture Characterization

ISO 25178 is considered one of the main milestones in the characterization of 3D areal surface texture. It is based on the principle that nature is inherently three-dimensional. Thus, it is the...

Tuesday, June 9, 2020
Webinar 11th of June, 2020: Tribology, Measuring Surfaces Effectively

Thu, Jun 11, 2020 10:00 AM - 11:00 AM CEST
Thu, Jun 11, 2020 6:00 PM - 7:00 PM CEST

In this webinar you will expand your knowledge in roughness characterization by moving from contact stylus profile Ra analysis to Sa Optical areal analysis.
Wear...

Thursday, April 30, 2020
Advancing Virology Research with High-Resolution AFM Imaging

Cypher VRS Video-Rate AFM

Atomic Force Microscopy (AFM) is a uniquely powerful tool for virology research. High-resolution imaging techniques, including both AFM and electron microscopy, can easily resolve the size and shape of virus particles and even the organization of capsomeres in their capsid protein shells...

Saturday, April 18, 2020
Webinar 22/04/2020 - All you need to know about surface measurements in Tooling

Wednesday, April 22nd, 2020 - 10:00 AM to 11:00 AM  CEST

The designing and manufacturing of tools directly affects the production quality of the end-user industry, and metrology requirements in the tooling market are more challenging every day.

The need to measure thinner tools...

Friday, April 3, 2020

Sensofar S Wide - Large area 3D optical profilometer

Wednesday, April 8th, 2020 - 10:00 AM to 11:00 AM  CEST

Presented by: Carles Otero & Sandra de Pedro

Learn all about Sensofar’s new...

Friday, February 7, 2020
High speed DHM® equipped with a Nova Photron Camera

New World Record!

A new milestone has been reached in the field of ultrafast 3D topography measurements with the delivery to Professor James Friends, University California of San Diego, of a DHM T1000 equipped with a Photron Nova high speed camera enabling 12’500 3D...

Friday, January 31, 2020
Side view of an RMN AFM probe

Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact...

Monday, January 13, 2020
Empty-Warehouse Operation: optical profilometers and benchtop SEM for sale!

PROMOTION ENDED - All the instruments have been sold

We are selling two 3D optical profilometers (Sensofar S Neox and GBS Ilmenau Compact) and a very recently produced benchtop SEM (manufactured by the korean company Emcrafts). They have never been installed...

Thursday, May 30, 2019
GBS Ilmenau - Unique features presented at the Control Show 2019 in Stuttgart

GBS ILmenau has exhibited their instruments at the Control Show in Stuttgart at the beginning of May. As many competitors they wanted to demonstrate their capabilities. Since not everyone had the opportunity to visit the exhibition we've picked up a few applications in the form of 3D scans....

Friday, April 19, 2019
3D image of a mouse neuron taken by digital holographic microscopy. Image Credit: Lyncée

May 21st to May 23rd, 2019
San Raffaele Hospital - Via Olgettina, 48 – 20132 Milano 

Three days of study and practical tests dedicated to holographic technologies applied to biological samples

...
Tuesday, April 2, 2019
New video! Performance of unique CPEM™ technique

Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...

Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!

LiteScope...

Wednesday, March 20, 2019
Tomocube HT-2H - Holotomographic instrument

Apoptosis induced by TNFα treatment. NIH3T3 cells were imaged live and continuously using HT-2H. 3D tomogram was taken every 5 minutes for up to 2 hours.

Monday, February 18, 2019
new S neox 3D Optical Profiler

Schaefer Italy is proud to announce the release by Sensofar Metrology of the 5th generation of its flagship optical profiler. The S neox is a high-performance non-contact 3D optical profiler microscope system purposely-designed for sub-nano, nano and micro-scale...

Tuesday, April 24, 2018
SmartWLI compact - White light interferometer for industrial applications

The accelerated smartWLI's getting now integrated in production lines. With high-speed cameras and  real time calculation of the point cloud on graphic boards achieve the GBS now with white-light interferometers height resolutions of 0.1 nm and cycle times below 1 s. The image acquisition with...

Monday, June 12, 2017
Nuove tecnologie per la misura della struttura superficiale: Confocal Fusion e Continuous Confocal - Webinar

Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies –Confocal Fusion & Continuous Confocal– represent significant new developments in 3D surface metrology, and underline Sensofar’s...

Monday, March 27, 2017
New technologies for 3D surface metrology - Confocal Fusion and Continuous Confocal

Confocal Fusion and Continuous Confocal are two new acquisition technologies developed by Sensofar that build on the existing S line hardware. For existing S line systems that feature at least Confocal and Focus Variation technologies (S neox, S lynx & S...

Tuesday, April 5, 2016
CSI Instruments - AFM Training Courses 2016 - New AFM feature : Magnetic Lateral Force Microscopy

CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....

Monday, February 8, 2016
New Mikromasch OPUS AFM - Optimized Positioning Upon Sample

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly...

Monday, October 26, 2015
AAC awards Best Paper to Sensofar

In the last report of the Aluminum Anodizers Annual Conference & Exhibition (Pittsburgh, 2014), Sensofar's "Using optical areal measurement methods to assess the surface shape and texture on aluminium anodized surfaces" article submission has received the Robert L. Kersman Award of...

Monday, February 2, 2015
PanScan Freedom-LT - RHK Technology

All the advantages of LT, None of the constraints

PanScan Freedom enables ultra low noise <1 pm imaging performance, with the cryostat running. Even noisy environments do not degrade performance, which was proven...