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The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the...
Surface science is the study of physical and chemical phenomena that occur at the interface of two phases, including solid-liquid interfaces, solid-gas interfaces, solid-vacuum interfaces, and liquid-gas interfaces. It includes the fields of surface chemistry and surface physics.
The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the...
A lightweight and compact vibration absorption systems allows to significantly reduce unwanted vibrations translated to working environment from various environment disturbances. Developed by engineers, physicists, and leading industry consultants with expertise in vibration isolation and...
KNS lightweight and compact modular active vibration isolation systems counteract vibrations affecting sensitive equipment. The streamlined design allows easy installation procedure and its straightforward composition requires no follow-up tuning. Developed by engineers, physicists, and leading...
A lightweight and compact table top active vibration isolation system that counteracts unwanted vibrations for sensitive equipment. The streamlined design allows it to seamlessly become part of the workstation environment, and its straightforward composition requires no follow-up tuning.
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Speedytec
R9plus BUILT for a PURPOSE: Your Research, Your Success When you are pioneering the frontiers of Nanoscience, you can count on RHK’s new R9plus SPM Controller to lead the way. Its remarkable advancements originate from direct user feedback, RHK’s Technical Advisory Board, and...
The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and...
Isolating Sub-Hertz Vibrations
DVIA-T is highly effective in isolating ultra-precision instruments from ambient vibrations ranging 1–10 Hz, where the vibration-sensitive...
Get an optical profilometer for less than half the price of an AFM or 3D stylus profilometer! The Profilm3D uses state-of-the-art white light interferometry (WLI) to measure surface profiles and roughness down to 0.05 µm; adding the low-cost PSI option takes the minimum vertical feature size...
The Lens-less sensor is a fixed field of view DHM®, this unique patented design is robust and ideal for industrial applications. The reflection configuration measures 3D topography with a sub-nanometric resolution.
Digital holography offers significant advantages compare to others 3D...
NenoCase™ is not only easy to use storage case but also opens new possibilities of usage LiteScope™ as a stand-alone device. It incorporates passive antivibration system to ensure high quality imaging outside the SEM chambers. NenoCase™ can be purged with different gases used for measurements...
3D surface sensor optimized for in-line and mobile use requiring high performance in harsh environments with extremely short cycle times.
Operation without vibration...
The Five Axis 3D optical profiler combines a high-accuracy rotational module with advanced inspection and analysis capabilities. This enables automatic 3D surface measurements at defined positions which combine to create full 3D volumetric measurements. Three measurement technologies cover a...
The Nanomechanics InSEM HT provides 800°C isothermal heating of the InForce tip and sample for the InSEM in-situ mechanical properties microprobe. Independent control of the tip and sample temperatures is integrated with multi-location thermocouple feedback, active cooling, and of course the...
The S onix provides the speed required in a high-throughput industrial metrology system. With its high-speed camera and optimized optical and mechanical design, S onix is up to 7 times faster than other interferometric systems available today. Vertical resolution has been maintained, where the...
Classical optical microscopes can be expanded into a fullfledged 3-D surface instrument, significantly increasing their usefulness. Using this measurement principle high-precision 3-D data can be collected throughout the viewable range of the microscope. Various types of 3-D analyses can then be...
Stand-alone 3D surface measurement device based on white light interferometry. The system includes a lens turret and a motorized XY stage. This also shows a large area of the surface is possible (stitching).
The S mart is the culmination of more than 14 years of experience in the development of surface metrology systems. It was designed right from the initial conception to be integrated into production systems and to withstand harsh environments. Being compact, lightweight, and with flexible...
S lynx is a new high-resolution non-contact 3D surface profiler in a more compact format. This system draws on over 14 years of experience in designing optical metrology systems for both R&D and industry, enabling Sensofar to pack all the performance of Sensofar's S line of high-end 3D...
The Nano-Observer is a flexible and powerful STM/AFM Microscope. Designed with the ultimate technologies, it combines performance and ease of use. The USB controller offers a real integrated lock-in for better measurement capability (...
The NanoFlip nanoindenter is designed to be the most versatile mechanical properties testing instrument on the market today, by offering researchers the option to use the tool in both in-situ environments and ambient settings depending on the demands of the experiment. By offering the highest...
The caulked aluminium frame and the special "high thickness wire" panels technology allow an average dampening level of 32 dB.
The internal finishing is made by "open cells" autoestinguishing phonoabsorbing polyurethane foam with pyramidal design, gray anthracite colour. Two Pro 32 walls...
For over 30 years the world's leading researchers have depended on RHK to deliver the highest performance SPMs and control systems, with more than 1,000 installed. The PanScan-Freedom LT is an innovative new closed-cycle cryogen-free system for stable low temperature performance, unprecedented...
The iNano™ nanoindenter is made easy and affordable by offering repeatability, accuracy and precision at a price that puts nanoindentation capability into reach for any lab's budget, from leading universities to high tech companies.
By...
Two HQ:NSC probe models are available with a special coating for Magnetic Force Microscopy.
The coating consists of a 60 nm cobalt layer on both the tipside and backside and is protected from oxidation with a 20 nm chromium film. The cantilever parameters are optimized for stable...
PHASIS Ferroelectric PZT films are epitaxially grown using off-axis RF magnetron sputtering on different substrates.
PHASIS Epitaxial Ferroelectric Thin FilmsThe films present an extremely high degree of structural quality including surfaces with very low corrugation and also good...
BioNano substrates are produced on different glass slides with or without a titanium adhesion layer. The films are grown in controlled high vacuum deposition systems. The coatings present very smooth surfaces with very low root mean square roughness.
The typical gold thickness PHASIS...
Phasis provides gold Au(111) thin films on freshly cleaved mica substrates. The films are grown in controlled high vacuum deposition systems. The films present an extremely high degree of structural quality including surfaces with well defined terraces.
The P-7 offers industry leading measurement repeatability for reliable measurement performance. The system has 150 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching. The UltraLite® sensor includes dynamic force control...
The MicroXAM-1200 3D non-contact profilometer is a surface characterization solution for a wide range of applications and industries - from R&D departments, universities, and commercial labs to production monitoring and process control in IC manufacturing and data storage. The non-contact...
The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6...
3D Surface Profilometer and Optical Interferometer
The KLA-Tencor Development Series of 3D surface profilers offer a complete optical surface profilometer and optical interferometer solution focusing on the needs of the engineering and research community. Our 3D surface...
The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8Ã… (1 sigma) or 0.1%...
The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured...
The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured...
The QFM-Module comprises two components:
Controller
Frequency Range
5 kHz - 20 kHz (Tapping Mode in liquid)
20 kHz - 100 kHz (Magnetic/Electrostatic Force Microscopy)
100 kHz - 500 kHz (Tapping Mode in air...
RHK’s new R9 Controller provides a complete, fully digital AFM/STM control system in an ultra-integrated, user-configurable and programmable one-box solution. As the next-generation in RHK’s long history of innovative control technology, R9 delivers...
RHK brings affordable magnetic capability with uncompromised UHV AFM/STM VT performance. At a fraction of the cost of typical magnet systems, RHK's new VMF delivers a magnetic field in plane with the sample and variable to 3000 gauss (optional 1 Tesla). MF Data: RHK's system delivers atomic...
RHK Technology is the provider of the world’s highest performance combination SPM/Surface Analysis systems. Customers can choose the compenents they wish to have integrated with RHK SPM, We will design a best-of-breed system optimized for top performance. Combination systems are fully integrated...
Four Independent, Cryogenic, Atomic-Resolution Probes A true low-temperature (10K) UHV 4-Probe system is one of a family of multi-probe UHV SPM systems made possible by RHK Technology. This system provides a complete multi-technique, multi-chamber UHV system and...
Standard UHV 7500 STM/AFM with sample heating and LHe cooling. System mounted on a two-chamber frame allowing future expansion of second chamber for sample preparation and analysis. System includes load lock capable of transferring multiple probes/samples during each cycle, saving time and...
UHV STM system mounted on a three chamber frame. Preparation chamber includes LEED/Auger, sputter ion gun, MBE K-cell, H2 cracker, and numerous spare ports for future expansion capability. System also contains a load lock and manipulator with sample heating (radiative, resistive, and e-beam...