Surface Science

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and...

Get an optical profilometer for less than half the price of an AFM or 3D stylus profilometer! The Profilm3D uses state-of-the-art white light interferometry (WLI) to measure surface profiles and roughness down to 0.05 µm; adding the low-cost PSI option takes the minimum vertical feature size...

NenoCase™ is not only easy to use storage case but also opens new possibilities of usage LiteScope™ as a stand-alone device. It incorporates passive antivibration system to ensure high quality imaging outside the SEM chambers. NenoCase™ can be purged with different gases used for measurements...

The Five Axis 3D optical profiler combines a high-accuracy rotational module with advanced inspection and analysis capabilities. This enables automatic 3D surface measurements at defined positions which combine to create full 3D volumetric measurements. Three measurement technologies cover a...

The S onix provides the speed required in a high-throughput industrial metrology system. With its high-speed camera and optimized optical and mechanical design, S onix is up to 7 times faster than other interferometric systems available today. Vertical resolution has been maintained, where the...

Stand-alone 3D surface measurement device based on white light interferometry. The system includes a lens turret and a motorized XY stage. This also shows a large area of the surface is possible (stitching).

S lynx is a new high-resolution non-contact 3D surface profiler in a more compact format. This system draws on over 14 years of experience in designing optical metrology systems for both R&D and industry, enabling Sensofar to pack all the performance of Sensofar's S line of high-end 3D...

The NanoFlip nanoindenter is designed to be the most versatile mechanical properties testing instrument on the market today, by offering researchers the option to use the tool in both in-situ environments and ambient settings depending on the demands of the experiment. By offering the highest...

For over 30 years the world's leading researchers have depended on RHK to deliver the highest performance SPMs and control systems, with more than 1,000 installed. The PanScan-Freedom LT is an innovative new closed-cycle cryogen-free system for stable low temperature performance, unprecedented...

Two HQ:NSC probe models are available with a special coating for Magnetic Force Microscopy.
The coating consists of a 60 nm cobalt layer on both the tipside and backside and is protected from oxidation with a 20 nm chromium film. The cantilever parameters are optimized for stable...

BioNano substrates are produced on different glass slides with or without a titanium adhesion layer. The films are grown in controlled high vacuum deposition systems. The coatings present very smooth surfaces with very low root mean square roughness.

The typical gold thickness PHASIS...

The P-7 offers industry leading measurement repeatability for reliable measurement performance.  The system has 150 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching.  The UltraLite® sensor includes dynamic force control...

The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications. The P-6...

The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8Ã… (1 sigma) or 0.1%...

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured...

RHK’s new R9 Controller provides a complete, fully digital AFM/STM control system in an ultra-integrated, user-configurable and programmable one-box solution. As the next-generation in RHK’s long history of innovative control technology, R9 delivers...

RHK Technology is the provider of the world’s highest performance combination SPM/Surface Analysis systems. Customers can choose the compenents they wish to have integrated with RHK SPM, We will design a best-of-breed system optimized for top performance. Combination systems are fully integrated...

Standard UHV 7500 STM/AFM with sample heating and LHe cooling. System mounted on a two-chamber frame allowing future expansion of second chamber for sample preparation and analysis. System includes load lock capable of transferring multiple probes/samples during each cycle, saving time and...