Silicon Contact Mode Probes - SICON Series

S ICON Series Probes are for contact mode applications. These probes have a long, thin cantilever allowing for a low spring constant and improved laser clearance.

Technical Features

Cantilever ParameterNominal Value
Spring Constant (N/m)0.2
Frequency (kHz)12
Length (μm)450
Width (μm)40
Thickness (μm)2.5