Webinar August 19, 2020: Characterization of two-dimensional materials with atomic force microscopy

Wednesday, August 5, 2020
Webinar August 19, 2020: Characterization of two-dimensional materials with atomic force microscopy

Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical properties from the atomic scale to device scale.

The webinar will begin with an introduction to these capabilities by Asylum Research applications scientist Dr. Ted Limpoco. Then Professor Zhihai Cheng from Renmin University of China will present results from several of his group’s research projects on the interfacial structures and properties of 2D materials.

 Register for this webinar to learn how AFM can:

  • Resolve the structure of 2D materials to evaluate their preparation and modification
  • Measure and map the unique electrical and mechanical properties of 2D materials
  • Evaluate the performance of 2D materials incorporated within proposed devices

Related products 

The base model of the Cypher AFM microscope family
Asylum Research Cypher ES
Full environmental control features
Cypher ES Polymer Edition AFM
A special configuration of the Cypher ES AFM for polymer science research
Cypher VRS Video-Rate AFM
The first and only full-featured video-rate AFM

Partner 

Asylum Research - Oxford Instruments

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