spm

All the articles in our blog about spm

Wednesday, March 22, 2023
Galaxy Dual Controller - Webinar

AFM Agilent 5100 e 5500 e Multimode - Nuova vita al tuo microscopio - Mantieni le modalità AFM esistenti e aggiungi nuove modalità avanzate!

FREE webinar on Thursday, 30th March 2023

Two time zones available 

See in real time how your old...

Wednesday, February 8, 2023
How to Choose the Right AFM Probes for Your Application

Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.

Even for an experienced AFM user, choosing the right probe can be daunting. Using an...

Monday, January 16, 2023
 The Future of Quantitative PFM

Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...

Friday, November 18, 2022
New Accessory for Jupiter XR AFM: nanoTDDB

Nuovo accessorio per il Jupiter XR AFM: nanoTDDB

Abstract

In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...

Wednesday, October 19, 2022
Webinar - Force Curve Analysis with MountainsSPIP®- Digital Surf

Webinar host: Mathieu Cognard, product manager for SPM applications,

Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert

In this webinar, DS will demonstrate some of the...

Thursday, February 25, 2021
Photomask Repair - Adama Innovations atomically sharp and ultra-strong tips

New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!

  1. Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Monday, January 11, 2021
Sources of Vibration in a Lab

We're the distributors of Daeil Systems instruments. Daeil is a korean company that supplies a wide range of vibration isolation systems, including thousands of optical tables, from passive to active isolation systems. Customers are industries,...

Wednesday, August 5, 2020
Webinar August 19, 2020: Characterization of two-dimensional materials with atomic force microscopy

Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...

Wednesday, June 24, 2020
AFM Electrical characterization with ResiScope, Soft ResiScope & HD-KFM modes

Webinar's key topics:

  • Advanced CSI AFM Modes – Electrical measurements
  • HD-KFM mode : Concept, advantages and exemples
    • Most advanced single-pass KFM mode (no lift)
    • Much higher sensitivity & resolution
    ...
Thursday, October 3, 2019
Probing Nanoscale Structure & Properties of Polymers: Advances in Atomic Force Microscopy

Live Webinar: October 16  16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST

Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...

Tuesday, April 2, 2019
New video! Performance of unique CPEM™ technique

Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...

Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!

LiteScope...

Tuesday, March 19, 2019
Free Webinar - R9plus SPM Controller from RHK Technology

Join us Tuesday, March 26 (Americas), Wednesday, March 27 (Europe), or Thursday, March 28 (Asia and Australia) for a webinar on the unique capabilities of the R9plus SPM Controller and its applications in the field of nano-optics. (Note, please feel free to attend...

Tuesday, June 20, 2017
High Definiton Kelvin Force Microscopy - BIMODAL HD-KFM

Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...

Monday, June 5, 2017

We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...

Wednesday, April 5, 2017
AFM Trade-In Operation - Get a percentage discount on the purchase of an AFM microscope Nano-Observer

Exchange your old equipment and get a percentage discount on the purchase of an AFM microscope Nano-Observer!

The Nano-Observer AFM microscope is 5 years old! To celebrate, CSI with Schaefer are offering up to 30% discount on the purchase of a new Nano-Observer when you...

Monday, September 5, 2016
PanScan Freedom Cryogen-Free LT AFM / STM

Schaefer is pleased to present you a long interview with Mr Craig Wall, PhD, Director of Marketing at RHK Technology. Mr Wall in this interview talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free afm spm low temp system and the high level performance it...

Tuesday, August 2, 2016
Park Systems Logo

Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...

Wednesday, June 22, 2016
Nano-Observer AFM Microscope Euro 2016 Challenge!

Follow the Euro 2016 with CSI and Win Prizes!

Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!

...
Tuesday, May 31, 2016
Beetle AFM - RHK Technology

Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...

Tuesday, April 5, 2016
CSI Instruments - AFM Training Courses 2016 - New AFM feature : Magnetic Lateral Force Microscopy

CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....

Monday, February 8, 2016
New Mikromasch OPUS AFM - Optimized Positioning Upon Sample

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly...

Wednesday, October 21, 2015
RHK Technology Cryogen-free PanScan Freedom SPM 9K version

Schaefer and the team at RHK Technology is excited to announce the launch of the new 9K PanScan Freedom System! Customers will now have the option to choose between the 15K and 9K versions of the cryogen-free SPM systems.

Tuesday, October 13, 2015
RHK Technology R9 Control System AFM SPM

Your partner in nanotechnology and innovation leader in SPM control systems welcomes you to join the next webinar in our Coffee Talk webinar series.
Did you know that you can use the R9 controller's flexibility to collect many more measurements in less time? You will be...

Tuesday, September 15, 2015
STM/AFM Microscope Nano-Observer from CSI Instruments, now with touch screen control!

A new video has been uploaded recently on YouTube. It provides a complete overview of the AFM Nano-Observer microscope, manufactured by CSI Instruments. Now this instrument is even easier to use, thanks to the touch screen control. You can operate the...

Tuesday, February 10, 2015
RHK TERS Tip Enhanced Raman Spectroscopy

RHK Technology has been a leader of Scanning Probe Microscope technology since the introduction of its first STM control system in 1988.  Hundreds of the world’s leading research groups depend on RHK’s cutting edge products...