All the articles in our blog about spm

Wednesday, June 24, 2020
AFM Electrical characterization with ResiScope, Soft ResiScope & HD-KFM modes

Webinar's key topics:

  • Advanced CSI AFM Modes – Electrical measurements
  • HD-KFM mode : Concept, advantages and exemples
    • Most advanced single-pass KFM mode (no lift)
    • Much higher sensitivity & resolution
Thursday, October 3, 2019
Probing Nanoscale Structure & Properties of Polymers: Advances in Atomic Force Microscopy

Live Webinar: October 16  16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST

Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...

Tuesday, April 2, 2019
New video! Performance of unique CPEM™ technique

Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...

Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!


Friday, March 22, 2019
Nenovision Litescope AFM-in-SEM

Explore capabilities of Nenovision AFM LiteScope™ 

  • AFM specially designed for easy SEM integration
  • A wide range of applications in the field of Material Science and Nanotechnology, Semiconductor Industry and Life Science
  • Unique correlative...
Tuesday, March 19, 2019
Free Webinar - R9plus SPM Controller from RHK Technology

Join us Tuesday, March 26 (Americas), Wednesday, March 27 (Europe), or Thursday, March 28 (Asia and Australia) for a webinar on the unique capabilities of the R9plus SPM Controller and its applications in the field of nano-optics. (Note, please feel free to attend...

Tuesday, May 15, 2018
Nenovision LiteScope™ - A unique AFM accessory for SEM

Discover this unique technology for electron microscopy

Easy integration and the combination of both Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) enable complex 3D sample analysis. That's the revolutionary technology of LiteScope™.


Tuesday, June 20, 2017
High Definiton Kelvin Force Microscopy - BIMODAL HD-KFM

Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...

Monday, June 5, 2017

We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...

Wednesday, April 5, 2017
AFM Trade-In Operation - Get a percentage discount on the purchase of an AFM microscope Nano-Observer

Exchange your old equipment and get a percentage discount on the purchase of an AFM microscope Nano-Observer!

The Nano-Observer AFM microscope is 5 years old! To celebrate, CSI with Schaefer are offering up to 30% discount on the purchase of a new Nano-Observer when you...

Monday, September 5, 2016
PanScan Freedom Cryogen-Free LT AFM / STM

Schaefer is pleased to present you a long interview with Mr Craig Wall, PhD, Director of Marketing at RHK Technology. Mr Wall in this interview talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free afm spm low temp system and the high level performance it...

Tuesday, August 2, 2016
Park Systems Logo

Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...

Wednesday, June 22, 2016
Nano-Observer AFM Microscope Euro 2016 Challenge!

Follow the Euro 2016 with CSI and Win Prizes!

Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!

Tuesday, May 31, 2016
Beetle AFM - RHK Technology

Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...

Tuesday, April 5, 2016
CSI Instruments - AFM Training Courses 2016 - New AFM feature : Magnetic Lateral Force Microscopy

CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....

Monday, February 8, 2016
New Mikromasch OPUS AFM - Optimized Positioning Upon Sample

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly...

Wednesday, October 21, 2015
RHK Technology Cryogen-free PanScan Freedom SPM 9K version

Schaefer and the team at RHK Technology is excited to announce the launch of the new 9K PanScan Freedom System! Customers will now have the option to choose between the 15K and 9K versions of the cryogen-free SPM systems.

Tuesday, October 13, 2015
RHK Technology R9 Control System AFM SPM

Your partner in nanotechnology and innovation leader in SPM control systems welcomes you to join the next webinar in our Coffee Talk webinar series.
Did you know that you can use the R9 controller's flexibility to collect many more measurements in less time? You will be...

Tuesday, September 15, 2015
STM/AFM Microscope Nano-Observer from CSI Instruments, now with touch screen control!

A new video has been uploaded recently on YouTube. It provides a complete overview of the AFM Nano-Observer microscope, manufactured by CSI Instruments. Now this instrument is even easier to use, thanks to the touch screen control. You can operate the...

Tuesday, February 10, 2015
RHK TERS Tip Enhanced Raman Spectroscopy

RHK Technology has been a leader of Scanning Probe Microscope technology since the introduction of its first STM control system in 1988.  Hundreds of the world’s leading research groups depend on RHK’s cutting edge products...