FREE webinar on Thursday, 30th March 2023
Two time zones available
See in real time how your old...
All the articles in our blog about spm
FREE webinar on Thursday, 30th March 2023
Two time zones available
See in real time how your old...
Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.
Even for an experienced AFM user, choosing the right probe can be daunting. Using an...
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...
Abstract
In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...
Webinar host: Mathieu Cognard, product manager for SPM applications,
Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert
In this webinar, DS will demonstrate some of the...
New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!
We're the distributors of Daeil Systems instruments. Daeil is a korean company that supplies a wide range of vibration isolation systems, including thousands of optical tables, from passive to active isolation systems. Customers are industries,...
Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...
Webinar's key topics:
With ResiScope AFM mode and Galaxy Dual Controller
The Galaxy Dual Controller can incorporate ResiScope mode, the unique AFM mode able to measure AFM...
Live Webinar: October 16 16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST
Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...
Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...
Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!
LiteScope...
Join us Tuesday, March 26 (Americas), Wednesday, March 27 (Europe), or Thursday, March 28 (Asia and Australia) for a webinar on the unique capabilities of the R9plus SPM Controller and its applications in the field of nano-optics. (Note, please feel free to attend...
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...
Exchange your old equipment and get a percentage discount on the purchase of an AFM microscope Nano-Observer!
The Nano-Observer AFM microscope is 5 years old! To celebrate, CSI with Schaefer are offering up to 30% discount on the purchase of a new Nano-Observer when you...
Schaefer is pleased to present you a long interview with Mr Craig Wall, PhD, Director of Marketing at RHK Technology. Mr Wall in this interview talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free afm spm low temp system and the high level performance it...
Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...
Follow the Euro 2016 with CSI and Win Prizes!
Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!
...Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...
CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly...
Schaefer and the team at RHK Technology is excited to announce the launch of the new 9K PanScan Freedom System! Customers will now have the option to choose between the 15K and 9K versions of the cryogen-free SPM systems.
Your partner in nanotechnology and innovation leader in SPM control systems welcomes you to join the next webinar in our Coffee Talk webinar series.
Did you know that you can use the R9 controller's flexibility to collect many more measurements in less time? You will be...
A new video has been uploaded recently on YouTube. It provides a complete overview of the AFM Nano-Observer microscope, manufactured by CSI Instruments. Now this instrument is even easier to use, thanks to the touch screen control. You can operate the...
RHK Technology has been a leader of Scanning Probe Microscope technology since the introduction of its first STM control system in 1988. Hundreds of the world’s leading research groups depend on RHK’s cutting edge products...