asylum oxford afm

All the articles in our blog about asylum oxford afm

Wednesday, February 8, 2023
How to Choose the Right AFM Probes for Your Application

Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.

Even for an experienced AFM user, choosing the right probe can be daunting. Using an...

Monday, January 16, 2023
 The Future of Quantitative PFM

Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...

Friday, November 18, 2022
New Accessory for Jupiter XR AFM: nanoTDDB

Nuovo accessorio per il Jupiter XR AFM: nanoTDDB

Abstract

In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...

Wednesday, October 19, 2022
Webinar - Force Curve Analysis with MountainsSPIP®- Digital Surf

Webinar host: Mathieu Cognard, product manager for SPM applications,

Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert

In this webinar, DS will demonstrate some of the...

Thursday, February 25, 2021
Photomask Repair - Adama Innovations atomically sharp and ultra-strong tips

New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!

  1. Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Wednesday, August 5, 2020
Webinar August 19, 2020: Characterization of two-dimensional materials with atomic force microscopy

Atomic force microscopy (AFM) is a particularly powerful technique for characterization of 2D materials including graphene and transition metal dichalcogenides like molybdenum disulfide (MoS2). AFM can easily measure not only topography but also electrical and mechanical...

Tuesday, July 21, 2020
Webinar - Measuring the Surface Roughness of Thin Films and Substrates with Atomic Force Microscopy

Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST

Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...

Monday, May 18, 2020
Webinar/Virtual Symposium - 27/05/2020 - Applications of Atomic Force Microscopy in Virology Research

Wednesday, May 27th, 2020 from 8:00 AM - 10:00 AM PDT  (3:00 PM - 5:00 PM GMT)

An online virtual symposium sponsored by Oxford Instruments Asylum Research on Applications of Atomic Force Microscopy in Virology Research. The symposium will feature a panel of...

Thursday, April 30, 2020
Advancing Virology Research with High-Resolution AFM Imaging

Cypher VRS Video-Rate AFM

Atomic Force Microscopy (AFM) is a uniquely powerful tool for virology research. High-resolution imaging techniques, including both AFM and electron microscopy, can easily resolve the size and shape of virus particles and even the organization of capsomeres in their capsid protein shells...

Thursday, March 12, 2020
Cypher VRS video-rate AFM - Webinar - Visualizing Biomolecular Reactions and Assemblies

The first and only full-featured video-rate AFM

Video-rate atomic force microscopy as a tool for single molecule biochemistry and biophysics

Join us Tuesday, March 17
08:00 PDT / 11:00 EDT / 15:00 BST / 16:00 CEST

Direct...

Monday, November 18, 2019
AFM Shows How Graphene Slips Under Strain

The ultra-low surface friction of graphene and other 2D materials offers exciting possibilities for nano-thin lubricants in next-generation MEMS and NEMS devices. The ability to actively control, and preferably minimize, friction would help realize the full potential of this application. In this...