High spring constant probe for contact AFM imaging
The 12Pt300B has a higher spring constant than the 12Pt400B. It is typically used for contact AFM imaging, when a higher resonance frequency is desired.
Material: Solid platinum probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy.
- Tip shank length: 80 μm (± 25%)
- Cantilever length: 300 μm (± 15%)
- Cantilever width: 60 μm (± 15%)
- Spring constant: 0.8 N/m (± 40%)
- Frequency: 9 kHz (± 30%)
- Tip radius: < 20 nm
Probes designed specifically for the Keysight (Agilent) Scanning Microwave Microscope (SMM) add-on have the letter A rather than B (ie 12Pt400A).
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Technical Features
Material: Solid platinum or platinum-iridium probe tip and cantilever supported on standard AFM probe sized ceramic chip, connected to conductive gold bonding pad with conductive epoxy. RMN also has probes available without gold contact pad, to help reduce stray capacitance.
Probes on standard sized substrates have a part number ending in the letter B (i.e. 25Pt300B).
Probes designed specifically for the Keysight (Agilent) Scanning Microwave Microscope (SMM) have the letter A rather than B (i.e. 12Pt400A).
Additional substrates:
- C - Substrate without gold bonding pad, to help reduce stray capacitance (= to A dimensions)
- D - Substrate has a 200um gold transmission line the entire length of the chip and the back is completely covered in gold (standard size chip)
- E - Substrate has the same features as the D substrate, only it is thinner (5 mil thick)