The 25PtIr200B-H is the updated version of RMN’s high frequency probe, with prolonged mechanical wear. It is typically used for non-contact and tapping mode AFM measurements. These probes are ideal for SNOM and high Frequency applications.
Tip shank length: 80 μm (± 25%)
Cantilever length: 200 µm (± 15%)
Cantilever width: 50 µm (± 15%)
Spring constant: 290 N/m (± 40%)
Frequency: 105 kHz (± 30%)
Standard tip radii below 20 nm
Tip radii below 10 nm on request - 25PtIr200B-H10
Non - standard probe tips and cantilevers upon request
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