Three additional substrates to RMNano solid Platinum and Platinum-Iridium ultra-sharp AFM probes!

Three additional substrates to RMNano solid Platinum and Platinum-Iridium ultra-sharp AFM probes!
Post publication date: 
Monday, September 23, 2019

Additional substrates:

  • C - Substrate without gold bonding pad, to help reduce stray capacitance (= to A dimensions)
  • D - Substrate has a 200um gold transmission line the entire length of the chip  and the back is completely covered in gold (standard size chip)
  • E - Substrate has the same features as the D substrate, only it is thinner (5 mil thick)

Rocky Mountain Technologies

  • Manufactures ultra-sharp, solid platinum and platinum-iridium AFM probes for high resolution electrical measurements
  • RMN probes never lose electrical signal due to wear or metal adhesion
  • Standard tip radius < 20 nm. Tip radius below 10nm available. (Larger tips also available)
  • Every probe imaged by FE-SEM to guarantee tip radius

RMN Probes can be used in various modes, including tapping and contact and are ideal for C-AFM, EFM, KPFM, PFM, SCM, SMM, SMIM, SNOM, and TERS applications.

(different frequencies, spring constants, and tip shank lengths are available)

Related products 

High spring constant probe for contact AFM imaging
12Pt400B
Lowest spring constant - 0.3 N/m (± 40%)
The high-spring constant RMN probe: 250 N/m (± 40%)
25Pt300B or 25Pt300A
The most versatile probe: a good choice for many applications
Versatile probe with a lower spring constant: 8 N/m (± 40%)
12PtIr400B or 12PtIr400A - Platinum-Iridium AFM probe with the lowest spring constant
Platinum-Iridium AFM probe with the lowest spring constant
25PtIr300B or 25PtIr300A
Platinum-Iridium high frequency AFM probes with prolonged mechanical wear
25PtIr300B or 25PtIr300A
Platinum-Iridium AFM probes with prolonged mechanical wear

Partner 

Rocky Mountain Nanotechnology