From June 25 to 30, 2026, Schaefer Tec will be participating in SELSIM 2026, the renowned international school and workshop on...
Scientific EquipmentAFM Probes
All the articles in our blog about AFM Probes
Friday, June 19, 2026
Monday, May 4, 2026
On Star Wars Day, CSInstruments marks a milestone: 20 years at the forefront of Atomic Force Microscopy. To celebrate, the company has launched a special anniversary page packed with surprises — an AFM-themed quiz to win exclusive gifts, a comic book series dedicated to the...
Thursday, April 16, 2026
We will be exhibiting at the International Scanning Probe Microscopy Conference with the NanoObserver II AFM and the Galaxy Dual Controller electronics. We are also organising on-site demonstrations at your lab in the days following the event.
We are pleased to announce...
Sunday, March 29, 2026
Schaefer SEE will be participating in NANOSEA 2026, the 9th International Conference on NANOstructures and Nanomaterials Self-Assembly, to be held in Catania, Sicily (Italy) from June 9 to 12, 2026.
NANOSEA is one of the most important European forums dedicated to the...
Tuesday, February 17, 2026
Schaefer will participate as sponsor at the CNR-IMM 2026 Congress “BRIDGE – Boosting Research and Innovation for a Digital and Green Economy”, taking place on...
Wednesday, February 8, 2023
Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.
Even for an experienced AFM user, choosing the right probe can be daunting. Using an...
Monday, January 16, 2023
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...
Friday, November 18, 2022
Nuovo accessorio per il Jupiter XR AFM: nanoTDDB
Abstract
In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...
Wednesday, October 19, 2022
Webinar host: Mathieu Cognard, product manager for SPM applications,
Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert
In this webinar, DS will demonstrate some of the...
Thursday, May 5, 2022
Would you like to get an exclusive first glimpse at the new features coming in Mountains® 9.2?
Then register now to join this upcoming webinar in which Alexis Morand, Learning engineer at Digital Surf, will walk you through the highlights of the latest version of...
Thursday, February 25, 2021
New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!
- Defect Repair - Repair of two photomask edge defects by machining the edge with a sharp robust diamond probe. Acquired using an Asylum Research...
Tuesday, July 21, 2020
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
Wednesday, June 24, 2020
Webinar's key topics:
- Advanced CSI AFM Modes – Electrical measurements
- HD-KFM mode : Concept, advantages and exemples
- Most advanced single-pass KFM mode (no lift)
- Much higher sensitivity & resolution
Monday, May 11, 2020
Galaxy Dual AFM Controller
With ResiScope AFM mode and Galaxy Dual Controller
The Galaxy Dual Controller can incorporate ResiScope mode, the unique AFM mode able to measure AFM...
Friday, January 31, 2020
Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact...
Thursday, October 3, 2019
Live Webinar: October 16 16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST
Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...
Tuesday, June 20, 2017
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
Monday, June 5, 2017
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...
Tuesday, August 2, 2016
Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...
Wednesday, June 22, 2016
Follow the Euro 2016 with CSI and Win Prizes!
Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!
...Tuesday, May 31, 2016
Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...
Tuesday, April 5, 2016
CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....
Monday, February 8, 2016
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly...
Tuesday, January 13, 2015
Schaefer is proud to offer to their customers a special promo, to evaluate the all-diamond AFM probes NaDia Probes, manufactured by Advanced Diamond Technologies. Those AFM probes are built with a single, monolithic diamond structure. The key...