All the articles in our blog about AFM Probes
Register for the AFM Probe Selection webinar. On Feb. 15 Asylum's experts will do a deep dive into the subject, providing information useful for beginner to advanced AFM users.
Even for an experienced AFM user, choosing the right probe can be daunting. Using an...
Piezoresponse Force Microscopy (PFM) is one of the most powerful techniques for nanoscale characterization of piezoelectric and ferroelectric materials. Despite many advances over the last 30 years, however, it has remained challenging to make...
Nuovo accessorio per il Jupiter XR AFM: nanoTDDB
Abstract
In the field of microelectronics, metal-oxide-semiconductor field effect transistor (MOSFET) devices use high-k gate dielectric materials, such as hafnium dioxide (HfO₂) with a dielectric constant in the range of 18-25. This material, under a metal gate,...
Webinar host: Mathieu Cognard, product manager for SPM applications,
Digital Surf Main speaker: Dalia Yablon, founder of SurfaceChar LLC, material characterization & nanotechnology expert
In this webinar, DS will demonstrate some of the...
Would you like to get an exclusive first glimpse at the new features coming in Mountains® 9.2?
Then register now to join this upcoming webinar in which Alexis Morand, Learning engineer at Digital Surf, will walk you through the highlights of the latest version of...
New Photomask Repair Application Note. Come see how Adama Innovations atomically sharp and ultra-strong tips can help!
Wed, Jul 29, 2020 4:00 PM - 5:00 PM CEST
Surface roughness is an important measurement for thin films and substrates in a wide range of applications including semiconductor electronics, data storage, optics and other glass components, as well as thin films and coatings...
Webinar's key topics:
Galaxy Dual AFM Controller
With ResiScope AFM mode and Galaxy Dual Controller
The Galaxy Dual Controller can incorporate ResiScope mode, the unique AFM mode able to measure AFM...
Rocky Mountain Nanotechnology, LLC, is the only company that manufactures and sells ultra-sharp, solid platinum and platinum-iridium AFM probes, for high resolution electrical measurements. These probes can be used in various modes, including tapping and contact...
Live Webinar: October 16 16:00 BST / 11:00 EDT / 08:00 PDT / 17:00 CEST
Today’s characterization tools must provide information at scales down to micro- or even nanometer dimensions. This expert webinar will explore how atomic force microscopes (AFMs) are uniquely...
Electric characterization with the atomic force microscope has an increasing demand among the AFM community to solve new research topics in nanotechnology like energy harvesting, polymer or organic based electronics, or new advances in the semiconductor industry...
We are pleased to announce that we will be present at the "3rd BOLOGNA SPM WORKSHOP - SCANNING PROBE MICROSCOPY AND SPECTROSCOPY FOR MINERAL, BIOLOGICAL AND MATERIAL SCIENCES", on July 14, 2017 - Bologna.
The workshop will be held at the Dept. of Biological, Geological and Environmental...
Schaefer South-East Europe is happy to announce that Park Systems has just received a very important award from Frost & Sullivan. The most important innovation involves their proprietary SmartScan™ technology that allows any researcher to make high...
Follow the Euro 2016 with CSI and Win Prizes!
Join CSI for football and AFM: Predict the Euro 2016 winners from the Quarter-Final round to the Final, and win prizes from CSI!
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Here is a movie RHK made some days ago with the Beetle UHV750 HV AFM. This system is only turbo pumped. The sample is Si at 500C, measured in contact AFM mode. Each image took about 7 minutes. The acquisition ran for about 24 hours. The low drift is amazing. The...
CSInstruments is pleased to announce the CSInstruments Atomic Force Microscopy Training Courses 2016.
It will run from the 10th to 12th May, 2016 and take place at CSInstruments factory: 2 rue de la Terre de Feu - 91940 LES ULIS- FRANCE....
The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.
OPUS™ tips are available on all standard cantilever types for all commonly...
Schaefer is proud to offer to their customers a special promo, to evaluate the all-diamond AFM probes NaDia Probes, manufactured by Advanced Diamond Technologies. Those AFM probes are built with a single, monolithic diamond structure. The key...
