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Tuesday, February 17, 2026

Schaefer Sponsors CNR-IMM 2026 “BRIDGE” Congress – Catania, February 18–19, 2026

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3D imaging, 3D measurement, 3D profilometry, AFM microscopy, AFM Probes, atomic resolution, events, graphene, High temperature AFM imaging, High Vacuum - HV, interferometry, material science, mechanical characterization, MEMS, nanomaterials, optical profilometer, optical profilometry, profilometer non contact, profilometry, SEM - Scanning Electron Microscopy, Sensofar, spm, surface metrology measurements, Thin films, Ultra High Vacuum - UHV

CNR-IMM 2026 “BRIDGE” Congress – Catania, February 18–19, 2026

Schaefer will participate as sponsor at the CNR-IMM 2026 Congress “BRIDGE – Boosting Research and Innovation for a Digital and Green Economy”, taking place on...

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Ultra High Vacuum - UHV