Thin films

All the articles in our blog about Thin films

Thursday, September 10, 2026
Schaefer SEE at the SGI–SIMP 2026 Joint Congress in Padua
Tags:
3D imaging, 3D measurement, 3D profilometry, AFM consumables, AFM microscopy, AFM Probes, Elastic Modulus, events, interferometry, material science, nanomaterials, optical profilometer, optical profilometry, profilometer non contact, profilometry, rtec instruments, scanning probe microscopy, Scanning tunneling spectroscopy, SEM - Scanning Electron Microscopy, Sensofar, spm, surface metrology measurements, Tabletop SEM, Thin films, tribological tests, tribology, tribometers, tribometry
Schaefer SEE at SGI-SIMP 2026 in Padua with ONYX tabletop SEM, S neox 6 optical profilometer, MFT-5000 tribometer, N70 micro-CT scanner and Nano-Observer II AFM.

15–17 September 2026 | Padova Congress, Padua, Italy

Schaefer SEE is pleased to participate as a sponsor and exhibitor at Ter(r)ra: Resources, Risks, Respect, the 2026 Joint Congress of the Italian Geological...

Read the article
Sunday, August 23, 2026
Sample Preparation and SEM Observation, in One Compact and Complete Solution
Tags:
High Vacuum - HV, material science, SEM - Scanning Electron Microscopy, Tabletop SEM, Thin films
G5 sputter coater and NANOS tabletop SEM infographic: sample preparation for SEM analysis

The G5 Ion Sputter Coater by GSEM is a compact, easy-to-use, and cost-effective instrument for preparing samples destined for SEM analysis.

Thanks to its fully automatic operation, the G5 handles the main stages of the coating process — vacuum,...

Read the article
Thursday, July 9, 2026
Nanos tabletop SEM with integrated EDS Analysis: Adding Chemical Insight to Electron Microscopy
Tags:
Ceramics, material science, nanomaterials, SEM - Scanning Electron Microscopy, spectroscopy, Tabletop SEM, Thin films
Tabletop SEM Nanos with integrated EDS

In material analysis, seeing the surface of a sample is often only the first step. A tabletop SEM allows laboratories to observe morphology, topography, defects, particles, coatings, and microstructural features at high magnification. But to fully...

Read the article
Tuesday, February 17, 2026
Schaefer Sponsors CNR-IMM 2026 “BRIDGE” Congress – Catania, February 18–19, 2026
Tags:
3D imaging, 3D measurement, 3D profilometry, AFM microscopy, AFM Probes, atomic resolution, events, graphene, High temperature AFM imaging, High Vacuum - HV, interferometry, material science, mechanical characterization, MEMS, nanomaterials, optical profilometer, optical profilometry, profilometer non contact, profilometry, SEM - Scanning Electron Microscopy, Sensofar, spm, surface metrology measurements, Thin films, Ultra High Vacuum - UHV
CNR-IMM 2026 “BRIDGE” Congress – Catania, February 18–19, 2026

Schaefer will participate as sponsor at the CNR-IMM 2026 Congress “BRIDGE – Boosting Research and Innovation for a Digital and Green Economy”, taking place on...

Read the article
Tuesday, November 18, 2014
Why do we still need nanoindenters to measure small material volumes mechanical properties?
Tags:
nanoindentation, nanomechanics inc, Elastic Modulus, nanomaterials, Thin films
iNano Nanomechanics nanoindenter

Scanning techniques for the determination of mechanical properties (mainly the Elastic modulus) of nano-materials and thin films have emerged over the past few years. The high throughput of such scanning techniques have drawn high interest within the nanoscale scientists...

Read the article