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Schaefer Sponsors CNR-IMM 2026 “BRIDGE” Congress – Catania, February 18–19, 2026
Event - Congress -Workshop
Wednesday 18 February 2026 - 13:30 to Thursday 19 February 2026 - 17:00
Schaefer will participate as sponsor at the CNR-IMM 2026 Congress “BRIDGE – Boosting Research and Innovation for a Digital and Green Economy”, taking place on February 18–19, 2026 at the Department of Physics, University of Catania.
The event, organized by CNR-IMM (Institute for Microelectronics and Microsystems of the Italian National Research Council), represents a key opportunity for discussion between research and industry in the fields of advanced materials, micro and nanoelectronics, sustainable energy, quantum technologies, and high-performance devices.
The scientific program addresses major topics such as:
2D and layered materials
Wide band gap semiconductors
Advanced characterization methods
Technologies for energy, sensing, and life science
Innovative devices for computing and quantum technologies
Large-area and high-power electronics
In this context, Schaefer offers a comprehensive portfolio of solutions for deposition, surface analysis, and advanced materials characterization, supporting research laboratories, universities, and high-tech industries.
UHV Systems for Research and Deposition – PREVAC
We are highlighting the Ultra High Vacuum (UHV) systems by PREVAC, ideal for:
Thin film growth and deposition
Research on 2D materials and advanced semiconductors
Surface analysis under controlled environments
Integration with in-situ characterization techniques
PREVAC solutions ensure modularity, high stability, and full customization, meeting the demanding requirements of micro- and nano-electronics research.
Compact and High-Performance Tabletop SEM – NANOS by Semplor
At the congress, we are also showcasing NANOS, the tabletop SEM by Semplor:
Compact and easy to install
High resolution for morphological analysis
Ideal for university labs, R&D departments, and quality control
A cost-effective solution without compromising professional performance
A powerful tool for analyzing microstructures, defects, surface morphology, and failure analysis.
Optical Profilometry and 3D Surface Analysis – GBS and Sensofar
For advanced surface characterization, we present GBS and Sensofar optical profilometers, leading solutions for:
Roughness measurement (Ra, Rq, etc.)
3D surface morphology analysis
Non-contact measurements
Evaluation of coatings, thin films, and microstructures
These technologies are essential in fields such as:
Microelectronics and semiconductors
Photovoltaics and energy devices
Functional materials and advanced coatings
Related products
Nanos
S neox
S lynx 2
Smart-WLI Next
STM/AFM Microscope Nano-Observer
Partner
CSI Concept Scientific Instruments
GBS-Ilmenau GmbH
Semplor
Sensofar
Related categories
3D Optical Profilometers Non-contact
SEM - Scanning Electron Microscopes
AFM/SPM Microscopes