Schaefer will participate in the 17th Multinational Congress on Microscopy (17MCM), which will be held from 7 to 12 September 2025 in Portorož, Slovenia.
In collaboration with Semplor, we will showcase ...
All the articles in our blog about SEM - Scanning Electron Microscopy
Schaefer will participate in the 17th Multinational Congress on Microscopy (17MCM), which will be held from 7 to 12 September 2025 in Portorož, Slovenia.
In collaboration with Semplor, we will showcase ...
DAEIL SYSTEMS’ DVIA-ML Series is a highly advanced vibration isolation system designed to optimize the imaging performance of electron microscopes, leveraging world-leading vibration control technology. This system maximizes experimental accuracy and provides...
Where: Naples, Maritime Station
The upcoming European Colloid and Interface Society Conference 2023 (...
Would you like to get an exclusive first glimpse at the new features coming in Mountains® 9.2?
Then register now to join this upcoming webinar in which Alexis Morand, Learning engineer at Digital Surf, will walk you through the highlights of the latest version of...
Schaefer's technological offer, for scientists and researchers, also includes acoustic booths, with a very high degree of customization. We have already gained significant experience in the field, delivering several booths to clients in industrial and academic research. Each...
We're the distributors of Daeil Systems instruments. Daeil is a korean company that supplies a wide range of vibration isolation systems, including thousands of optical tables, from passive to active isolation systems. Customers are industries,...
We are selling two 3D optical profilometers (Sensofar S Neox and GBS Ilmenau Compact) and a very recently produced benchtop SEM (manufactured by the korean company Emcrafts). They have never been installed...
Nanovision has brought the analysis and characterisation of graphene and 2D materials to the next level...
Check out this new video presenting the analysis of 2Dmaterials using the Nenovision AFM LiteScope in SEM!
LiteScope...