New features of the Lyncée Tec instruments software

Lyncée Tec, the swiss firm who manufactures nanometric 3D microscopes, distributed by Schaefer SEE Srl, has introduced in Paris, during the IEEE MEMS 2012 Conference at the beginning of February,  the newest features of their software.

Here they are:

- Adaptive sampling point intervals to match a maximum vertical displacement step (when the MEMS does not move there is no need to sample too much the cycle but when it moves it will sample more where there is a vertical displacement

- Output phase monitor temporal scale to match the MEMS device capacitor constant

-  Static and dynamic in-plane and out-of-plane information of MEMS devices in a single set-up at unmatched acquisition speed unaffected by environmental conditions

-  Nanometric, microscopic and millimetric scales for both static and dynamic measurements. All-in-one not achievable with any conventional AFM / Confocal or Interferometric techniques

-  Dynamic measurements abilities in kHz and MHz with stroboscopic module freezing movement down to 7.5 ns

-  Full Field absolute vertical displacement measurement which is not possible for laser vibrometers and also for MEMS device in liquids or under transparent membrane

-  The best comprehensive tool for statistical evaluation of MEMS devices

If you want to check these new features, you can ask for a demonstration.