Workshop Non-contact 3D Profilometer Sensofar S Neox - 11/12 March

Schaefer has organized two workshops from 11th to 12th of March, in Pisa and Genoa, to allow anyone who will attend to see the new Non-contact 3D Profilometer Sensofar S Neox in action. You can bring your own samples and have them measured live. The workshop is free to attend, here's the schedule:

1. 11th of March 10 AM in GENOVA at CNR IENI, via de Marini 6, Laboratori - 3° Piano
   Contacts:
   Ing. Alberto Passerone – Tel. 010 6475714, 335 396834
   Ing. Fabrizio Valenza – Tel. 010 6475 711
   Maria Luigia Muolo – Tel. 010 6475712, 366 5800122
2. 12th of March 10 AM in PISA at DICI-Dipartimento di Ingegneria Civile e Industriale - Largo Lucio Lazzarino, Pisa, boardroom 3rd floor main building.
   Contacts:
   Prof. Enrico Ciulli, ciulli@ing.unipi.it

Sensofar S Neox main features:

• S neox has four LED light sources inside its optical core: red (630 nm), green (530 nm), blue (460 nm) and white.
• S neox can incorporate a spectroscopic reflectometer, coupled through an optical fiber, for the measurement of thin films with thicknesses ranging from 10 nm and up to 10 layer stacks.
• The red, green and blue LEDs are pulsed to acquire real color images and high contrast color-coded depth information in real time
• Confocal images are taken at the highest camera resolution with very impressive details. A complete 3D scan is taken in less than 10 seconds
• A confocal RGB image view technique allows the user to observe nano-level details within a few microns range.