The 3D LS Spectrometer is the most advanced configuration of the LS Instruments modular goniometer based platform for multi-angle particle characterization based on static light scattering (SLS) and dynamic light scattering (DLS).
It contains the revolutionary and patented Modulated 3D Cross-Correlation technology that enables error-free measurement of even highly concentrated samples by eliminating multiple scattering. Sample dilution is a thing of the past; you can now examine your systems in their native state: Particle Sizing, Form-and Structure Factor, Molecular Weight, Rotational and Translational Diffusion Coefficient...
If you've ever performed laser light scattering experiments you know how tedious and time-consuming sample preparation can be. Often the sample concentration and cell diameter have to be selected with extreme care to avoid multiple scattering. In many cases this can be achieved only partially and it is well known that low-angle scattering is often hampered by multiple scattered light - sometimes unbeknown to the user! However, with the 3D LS Spectrometer, these are all problems of the past - You can stop worrying about multiple scattering.
Using the Modulated 3D Cross-Correlation the LSI instrument filters singly scattered light from the scattering signal and dismisses the rest. See what the experts say on the 3D technique:
"Importantly, the 3D setup is much more robust concerning the stability of the experimental setup compared to dual color crosscorrelation [...]. This method provides an excellent alternative to the also commercially available fiber optic light scattering technique." (W. Schärtl, "Light Scattering from Polymer Solutions and Nanoparticle Dispersions", Springer 2007)
The 3D LS Spectrometer does everything you have come to expect from a high-quality goniometer-based light scattering instrument for particle characterization. The growing list of scientific publications based on results obtained by our customers with the 3D LS Spectrometer is proof of the high quality of the instrument.
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3D cross-correlation measurements offer a wealth of information. To make these complex measurements as simple as possible LSI has designed a robust user-interface that allows fully automated measurements and analysis of the results! Easy to use software packets such as the LSI Zimm Plot software make data treatment a matter of only a few clicks. Test the LSI Zimm Plot software here: Free trial version with limited features
Technical Features
- Dynamic and static light scattering at scattering angles from 15°-150°
- Particle characterization from 0.15 nm to 5 microns*:
- hydrodynamic radius RH, radius of gyration RG, size distribution, form, and structure factor
- Determination of molecular weight
- Proprietary software interface for automated instrument operation and data analysis
- Automated particle sizing using Cumulant fit and CONTIN analysis
- Suppression of multiply scattered light using the 3D cross-correlation technology
- (down to 5% transmission for sub-mm path length)
- Straightforward procedure for robust alignment with excellent long-term stability
- Precise temperature control
- Nonergodic sample characterization using sample rotation stage (optional)
- Depolarized light scattering for measurement or rotational and translational diffusion coefficients (optional)
- Confidential online support forum for all customers
*maximum range, sample dependent