ThetaMetrisis

Precise, rapid and non-destructive characterization of coatings

ThetaMetrisis is a leading developer of high-performance tools for the non-destructive characterization of thin and thick films. Founded in 2009 as a high-tech spin-off, they specialize in White Light Reflectance Spectroscopy (WLRS), delivering rapid and accurate measurements of film thickness and optical properties.

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PDF icon ThetaMetrisis catalog - Film Characterization, deposition and biosensing tools2.43 MB

Products List

Thin-Film Thickness Measurement

FR-ES

FR-ES - Compact entry level system - non-destructive characterization of transparent and semi-transparent coatings
Compact entry level system
Product Sheet