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Conducti ve ACCES S Probes are silicon probes with conductive coatings (Platinum-Iridium and Gold) designed to allow a direct optical view of the AFM tip when imaging. ACCESS-EFM is coated with Platinum-Iridium, ACCESS-FM-GG is coated with gold. Both probes are ideal for Electrical Force Microscopy.
Technical Features
| Tip Specifications | |
|---|---|
| Reflex Side | Coated |
| Tip Side | Coated |
| Coating Options | Platinum-Iridium or Gold |