Applied NanoStructures' Step Height Standards are uniquely designed for X,Y, and Z calibration of scanning probe microscopes and profilometers. AppNano's Step Height Standard features are defined in thermally grown silicon dioxide on silicon substrate. A layer of Cr is deposited to harden the surface. AppNano's step height standards are available in two heights: 1μm and 100 nm.
SHS: Step Height Standards
Files and Documents: