The P-17 offers industry leading measurement repeatability for reliable measurement performance. The system has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching. The UltraLite® sensor includes dynamic force control, excellent linearity, and the highest vertical resolution making it the best sensor available on a stylus profiler. The P-17 includes many features to enhance the user experience such as top and side view optics, and motorized theta/leveling stages. Finally, the system includes point-and-click operation and the productivity package to offer the easiest to use tool on the market with the features required by university, R&D, and production environments.
The P-17 OF (open frame) includes all of the capability of the P-17, but allows the user to load larger samples on the 9.5 by 9.5-inch square stage or 300 mm sample chuck.
The P-17 offers industry leading measurement repeatability for reliable measurement performance. The system has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching. The UltraLite® sensor includes dynamic force control, excellent linearity, and the highest vertical resolution making it the best sensor available on a stylus profiler. The P-17 includes many features to enhance the user experience such as top and side view optics, and motorized theta/leveling stages. Finally, the system includes point-and-click operation and the productivity package to offer the easiest to use tool on the market with the features required by university, R&D, and production environments.
The P-17 OF (open frame) includes all of the capability of the P-17, but allows the user to load larger samples on the 9.5 by 9.5-inch square stage or 300 mm sample chuck.
Application Fields
Technical Features