Partector TEM Sampler

The Partector TEM by Naneos represents an innovative solution for the precise sampling of nanoparticles intended for analysis via Transmission Electron Microscope (TEM). Designed to meet the advanced needs of scientific and industrial research, this device offers a simplified and highly effective method for collecting particles ranging from 10 nm to 10 µm on standard 3.05 mm TEM grids.

With a time resolution of 1 second, the Partector TEM allows real-time measurement of particle specific surface area (LDSA), with a wide concentration range from 1 to 20,000 µm²/cm³. Additionally, its high sampling efficiency enables the collection of particles with unmatched precision, reaching up to 3% efficiency at 50 nm. The device is equipped with a rechargeable Li-Ion battery, providing up to 24 hours of operation, allowing for extended use without interruption.

What makes the Partector TEM unique is its ability to automatically determine the optimal sampling time, stopping the collection as soon as the grid has achieved the ideal coverage. This automated process saves valuable time while ensuring extremely accurate results. With a compact design and an intuitive graphical display, the Partector TEM is the ideal tool for research laboratories, quality control, and advanced nanoparticle studies.

Thanks to its compatibility with all major operating systems and the inclusion of a Java data analysis tool, the Partector TEM is the perfect solution for anyone looking for a simple, fast, and precise nanoparticle sampling tool for the electron microscope.