PILLAR (HAR)

High Aspect Ratio AFM probe made of single crystal diamond
Brand: 
Adama Innovations
Category: 
Sharp single crystal diamond

The High Aspect Ratio (HAR) pillar probes offer an ideal solution to robust imaging of samples with features with aggressive aspect ratios. Each probe consists of a cylindrical shaped pillar tip made of strong and conductive single crystal diamond.

These pillar probes, like on all our probes, are formed out of single crystal boron doped diamond and are strong, conductive, and capable up to a thousand scans.

  • P40:    ≤ 40nm diameter
  • P10:    ≤ 10nm diameter
  • P20:    ≤ 20nm diameter
  • P5:      ≤ 5nm diameter
Info Request
Ask for a quotation

News, events, promotions, webinars

25/02/2021
Photomask Repair with Adama Innovations atomically sharp and ultra-strong tips

Application Fields

Surface Science
MEMS characterization/Testing
Material Science

Technical Features

Adama Tip Specs
Tip ShapePillar
P40 Diameter (nm)20 - 40
P20 Diameter (nm)10 - 20
P10 Diameter (nm)5 - 10
P5 Diameter<5
Height (nm)100 ± 20
Tilt Angle (deg)0 ± 1
MaterialSingle Crystal Diamond
Model AD-2.8-P
Length (um)225 ± 10
Width (um)50 ± 5
Thickness (um)1.5 ± 0.5
Frequency (kHz)75 ± 25
Spring Constant (N/m)2.8 ± 1.8
Model AD-40-P
Length (um)225 ± 10
Width (um)40 ± 5
Thickness (um)3.0 ± 0.5
Frequency (kHz)200 ± 100
Spring Constant (N/m)40 ± 20
Info Request