PILLAR (HAR)

High Aspect Ratio AFM probe made of single crystal diamond

The High Aspect Ratio (HAR) pillar probes offer an ideal solution to robust imaging of samples with features with aggressive aspect ratios. Each probe consists of a cylindrical shaped pillar tip made of strong and conductive single crystal diamond.

These pillar probes, like on all our probes, are formed out of single crystal boron doped diamond and are strong, conductive, and capable up to a thousand scans.

  • P40:    ≤ 40nm diameter
  • P10:    ≤ 10nm diameter
  • P20:    ≤ 20nm diameter
  • P5:      ≤ 5nm diameter

Technical Features

Adama Tip Specs
Tip ShapePillar
P40 Diameter (nm)20 - 40
P20 Diameter (nm)10 - 20
P10 Diameter (nm)5 - 10
P5 Diameter<5
Height (nm)100 ± 20
Tilt Angle (deg)0 ± 1
MaterialSingle Crystal Diamond
Model AD-2.8-P
Length (um)225 ± 10
Width (um)50 ± 5
Thickness (um)1.5 ± 0.5
Frequency (kHz)75 ± 25
Spring Constant (N/m)2.8 ± 1.8
Model AD-40-P
Length (um)225 ± 10
Width (um)40 ± 5
Thickness (um)3.0 ± 0.5
Frequency (kHz)200 ± 100
Spring Constant (N/m)40 ± 20