High Aspect Ratio AFM probe made of single crystal diamond
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The High Aspect Ratio (HAR) pillar probes offer an ideal solution to robust imaging of samples with features with aggressive aspect ratios. Each probe consists of a cylindrical shaped pillar tip made of strong and conductive single crystal diamond.
These pillar probes, like on all our probes, are formed out of single crystal boron doped diamond and are strong, conductive, and capable up to a thousand scans.
- P40: ≤ 40nm diameter
- P10: ≤ 10nm diameter
- P20: ≤ 20nm diameter
- P5: ≤ 5nm diameter
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Technical Features
Adama Tip Specs
Tip Shape | Pillar |
P40 Diameter (nm) | 20 - 40 |
P20 Diameter (nm) | 10 - 20 |
P10 Diameter (nm) | 5 - 10 |
P5 Diameter | <5 |
Height (nm) | 100 ± 20 |
Tilt Angle (deg) | 0 ± 1 |
Material | Single Crystal Diamond |
Model AD-2.8-P
Length (um) | 225 ± 10 |
Width (um) | 50 ± 5 |
Thickness (um) | 1.5 ± 0.5 |
Frequency (kHz) | 75 ± 25 |
Spring Constant (N/m) | 2.8 ± 1.8 |
Model AD-40-P
Length (um) | 225 ± 10 |
Width (um) | 40 ± 5 |
Thickness (um) | 3.0 ± 0.5 |
Frequency (kHz) | 200 ± 100 |
Spring Constant (N/m) | 40 ± 20 |