5500: New universal SMM nose cone

Post publication date: 
Monday, September 2, 2013

In Q3, Agilent announced that exclusive SMM mode is now available to 5500 users thanks to our introduction of a universal SMM nose cone. The newly enhanced electrical measurement capabilities of the 5500 complement this flagship AFM system’s world-class imaging performance, outstanding application flexibility, and unparalleled environmental control.
The second-generation SMM nose cone is also fully compatible with 5420 and 5600LS AFM systems. Simplified setup of the scanner and the new nose cone reduces the number of steps required to begin collecting data and improves the probe exchange for all SMM users.
In addition to its impressive semiconductor test and characterization capabilities, SMM mode is ideal for studying glasses, polymers, ceramics, and metals, along with ferroelectric, dielectric, and PZT materials. It is also perfect for investigating organic films, membranes, and biological samples. Furthermore, SMM is highly useful for characterization of interfacial properties and contrast from molecular vibrational modes.

Documents and Files 

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PDF icon Scanning-Microwave-Microscopy-SMM-Mode.pdf306.01 KB